Hur, Jae
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1

Density functional theory study on the role of ternary allo..:

Ko, Won-Seok ; Yoon, Min-Seok ; Hur, Jae...
International Journal of Hydrogen Energy.  63 (2024)  - p. 151-162 , 2024
 
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2

Atomistic investigation of phase transformations in NiTiCu ..:

Ko, Won-Seok ; Hur, Jae ; Hwang, Jea-Young.
International Journal of Mechanical Sciences.  274 (2024)  - p. 109256 , 2024
 
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4

Scalable In-Memory Clustered Annealer With Temporal Noise o..:

Lu, Anni ; Hur, Jae ; Luo, Yuan-Chun...
IEEE Journal on Emerging and Selected Topics in Circuits and Systems.  13 (2023)  1 - p. 422-435 , 2023
 
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5

Machine Learning-Assisted Statistical Variation Analysis of..:

Choe, Gihun ; Ravindran, Prasanna Venkatesan ; Hur, Jae...
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 2015-2020 , 2023
 
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6

Interfacial Oxide Layer Scavenging in Ferroelectric Hf0.5Zr..:

Park, Chinsung ; Kashyap, Harshil ; Das, Dipjyoti...
IEEE Transactions on Electron Devices.  70 (2023)  8 - p. 4479-4483 , 2023
 
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7

Scalable In-Memory Clustered Annealer with Temporal Noise o..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lu, Anni ; Hur, Jae ; Luo, Yuan-Chun... - p. 22.5.1-22.5.4 , 2022
 
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9

Design and Optimization of Non-Volatile Capacitive Crossbar..:

Luo, Yuan-Chun ; Lu, Anni ; Hur, Jae..
IEEE Transactions on Circuits and Systems II: Express Briefs.  69 (2022)  3 - p. 784-788 , 2022
 
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10

Low-Frequency Noise Characteristics of BEOL-Compatible IWO ..:

, In: 2022 IEEE Silicon Nanoelectronics Workshop (SNW),
 
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11

Local Epitaxial Templating Effects in Ferroelectric and Ant..:

Chae, Kisung ; Lombardo, Sarah F. ; Tasneem, Nujhat...
ACS Applied Materials & Interfaces.  14 (2022)  32 - p. 36771-36780 , 2022
 
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12

A Technology Path for Scaling Embedded FeRAM to 28 nm and B..:

Luo, Yuan-Chun ; Hur, Jae ; Wang, Zheng...
IEEE Transactions on Electron Devices.  69 (2022)  1 - p. 109-114 , 2022
 
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13

Direct Quantitative Extraction of Internal Variables from M..:

, In: 2022 International Electron Devices Meeting (IEDM),
Passlack, Matthias ; Tasneem, Nujhat ; Wang, Zheng... - p. 32.4.1-32.4.4 , 2022
 
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15

Machine Learning Assisted Statistical Variation Analysis of..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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