Hur, Tae Hyung
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New Design Based Metrology for Fast Detection of Crucial Li..:

Hur, Duck-Hyung ; Kim, Tae-Heon ; Park, Chul-Hong...
Japanese Journal of Applied Physics.  50 (2011)  6S - p. 06GB11 , 2011
 
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12

New Design Based Metrology for Fast Detection of Crucial Li..:

Hur, Duck-Hyung ; Kim, Tae-Heon ; Park, Chul-Hong...
Japanese Journal of Applied Physics.  50 (2011)  6S - p. 06GB11 , 2011
 
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