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Ichiki, Kazuya
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1

Wafer Scale Insulation of High Aspect Ratio Through-Silicon..:

Jousseaume, Vincent ; Guerin, Chloe ; Ichiki, Kazuya...
ACS Applied Materials & Interfaces.  16 (2024)  24 - p. 31624-31635 , 2024
Link: https://doi.org/10.1021/..
 
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2

Feasibility study into the deposition of an organic planari..:

Ichiki, Kazuya ; Altemus, Bruce ; Gildea, Adam.
Thin Solid Films.  635 (2017)  - p. 23-26 , 2017
Link: https://doi.org/10.1016/..
 
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3

Ion-induced damage evaluation with Ar cluster ion beams:

Yamamoto, Yasuyuki ; Ichiki, Kazuya ; Seki, Toshio..
Surface and Interface Analysis.  45 (2012)  1 - p. 167-170 , 2012
Link: https://doi.org/10.1002/..
 
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4

Sputtered ion emission under size-selected Arn+ cluster ion..:

Gnaser, Hubert ; Ichiki, Kazuya ; Matsuo, Jiro
Surface and Interface Analysis.  45 (2012)  1 - p. 138-142 , 2012
Link: https://doi.org/10.1002/..
 
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5

Low-damage milling of an amino acid thin film with cluster ..:

Hada, Masaki ; Ibuki, Sachi ; Hontani, Yusaku...
Journal of Applied Physics.  110 (2011)  9 - p. , 2011
Link: https://doi.org/10.1063/..
 
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6

Characterization of vapor-deposited l-leucine nanofilm:

Hada, Masaki ; Ichiki, Kazuya ; Matsuo, Jiro
Thin Solid Films.  519 (2011)  6 - p. 1993-1997 , 2011
Link: https://doi.org/10.1016/..
 
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7

The effect of incident energy on molecular depth profiling ..:

Ninomiya, Satoshi ; Ichiki, Kazuya ; Yamada, Hideaki...
Surface and Interface Analysis.  43 (2011)  1-2 - p. 221-224 , 2011
Link: https://doi.org/10.1002/..
 
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8

Analysis of organic semiconductor multilayers with Ar clust..:

Ninomiya, Satoshi ; Ichiki, Kazuya ; Yamada, Hideaki...
Surface and Interface Analysis.  43 (2011)  1-2 - p. 95-98 , 2011
Link: https://doi.org/10.1002/..
 
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9

Strongly reduced fragmentation and soft emission processes ..:

Gnaser, Hubert ; Ichiki, Kazuya ; Matsuo, Jiro
Rapid Communications in Mass Spectrometry.  26 (2011)  1 - p. 1-8 , 2011
Link: https://doi.org/10.1002/..
 
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10

MeV-energy probe SIMS imaging of major components in animal..:

Yamada, Hideaki ; Ichiki, Kazuya ; Nakata, Yoshihiko...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  268 (2010)  11-12 - p. 1736-1740 , 2010
Link: https://doi.org/10.1016/..
 
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11

SIMS with highly excited primary beams for molecular depth ..:

Matsuo, Jiro ; Ninomiya, Satoshi ; Yamada, Hideaki...
Surface and Interface Analysis.  42 (2010)  10-11 - p. 1612-1615 , 2010
Link: https://doi.org/10.1002/..
 
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12

Molecular depth profiling of multilayer structures of organ..:

Ninomiya, Satoshi ; Ichiki, Kazuya ; Yamada, Hideaki...
Rapid Communications in Mass Spectrometry.  23 (2009)  20 - p. 3264-3268 , 2009
Link: https://doi.org/10.1002/..
 
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13

The emission process of secondary ions from solids bombarde..:

Ninomiya, Satoshi ; Ichiki, Kazuya ; Seki, Toshio..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  267 (2009)  16 - p. 2601-2604 , 2009
Link: https://doi.org/10.1016/..
 
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14

Study of crater formation and sputtering process with large..:

Aoki, Takaaki ; Seki, Toshio ; Ninomiya, Satoshi..
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  267 (2009)  8-9 - p. 1424-1427 , 2009
Link: https://doi.org/10.1016/..
 
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15

Precise and fast secondary ion mass spectrometry depth prof..:

Ninomiya, Satoshi ; Ichiki, Kazuya ; Yamada, Hideaki...
Rapid Communications in Mass Spectrometry.  23 (2009)  11 - p. 1601-1606 , 2009
Link: https://doi.org/10.1002/..
 
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