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2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC) ,
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A Novel Approach to Extract Embedded Memory Design Paramete..:
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2023 IEEE European Test Symposium (ETS) ,
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Density-oriented diagnostic data compression strategy for c..:
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2022 IEEE European Test Symposium (ETS) ,
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Optimized diagnostic strategy for embedded memories of Auto..:
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2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
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Recent Trends and Perspectives on Defect-Oriented Testing:
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2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
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