Isheim, D.
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1

Detailed Microstructural Investigation of Oxidation Phenome..:

Sung, Z.-H. ; Masi, A. ; Lee, J.-Y....
IEEE Transactions on Applied Superconductivity.  34 (2024)  3 - p. 1-4 , 2024
 
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2

Layer-thickness dependence of the compositions in strained ..:

Knipfer, B. ; Rajeev, A. ; Isheim, D....
Journal of Crystal Growth.  535 (2020)  - p. 125550 , 2020
 
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3

Isotopic Composition and Origin of Meteoritic Nanodiamonds ..:

Lewis, J. B. ; Floss, C. ; Isheim, D....
Microscopy and Microanalysis.  25 (2019)  S2 - p. 2524-2525 , 2019
 
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6

An Atom Probe Study of κ-carbide Precipitation in Austeniti..:

Bartlett, L. N. ; Van Aken, D. C. ; Medvedeva, J....
Metallurgical and Materials Transactions A.  48 (2017)  11 - p. 5500-5515 , 2017
 
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7

Electrical properties of lightly Ga-doped ZnO nanowires:

Alagha, S ; Heedt, S ; Vakulov, D...
Semiconductor Science and Technology.  32 (2017)  12 - p. 125010 , 2017
 
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8

Distinguishing Meteoritic Nanodiamonds from Amorphous Carbo..:

Lewis, J. B. ; Isheim, D. ; Floss, C..
Microscopy and Microanalysis.  23 (2017)  S1 - p. 678-679 , 2017
 
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9

Improving Local Electrode Performance by Tesla Coil Electri..:

Isheim, D. ; Akey, A. ; Gerstl, S.S.A.
Microscopy and Microanalysis.  23 (2017)  S1 - p. 712-713 , 2017
 
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12

Atom-Probe Tomography: Detection Efficiency and Resolution ..:

Isheim, D. ; Coakley, J. ; Radecka, A....
Microscopy and Microanalysis.  22 (2016)  S3 - p. 702-703 , 2016
 
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13

Correlated Atom-Probe Tomography and Transmission Electron ..:

Lewis, J. B. ; Isheim, D. ; Floss, C...
Microscopy and Microanalysis.  22 (2016)  S3 - p. 654-655 , 2016
 
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