Ishii, Yoshiaki
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1

Introduction of Highly Reliable Versatile Analog Platform w..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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5

Usability of detecting delivery errors during treatment of ..:

Honda, Hirofumi ; Tominaga, Masahide ; Sasaki, Motoharu...
Journal of Applied Clinical Medical Physics.  22 (2021)  7 - p. 66-76 , 2021
 
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6

Investigation of Electrode Materials for Developing Process..:

, In: 2021 IEEE International Meeting for Future Electron Devices, Kansai (IMFEDK),
 
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8

Study of Unique ESD Tolerance Dependence on Backgate Ratio ..:

, In: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Komatsu, Kanako ; Ozaki, Koichi ; Takeuchi, Fumio... - p. 315-318 , 2021
 
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10

Investigating the Highly Tolerant LDMOS Cell Array Design a..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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11

Investigation of the Breakdown Voltage Degradation under Ho..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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12

Defect Evaluation of O2-annealed TaOx for Transparent ReRAM..:

, In: 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK),
Doko, Soshun ; Suda, Yoriko ; Ishii, Yoshiaki. - p. 75-76 , 2019
 
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13

Transparent VPN failure recovery with virtualization:

Matsuhashi, Yohei ; Shinagawa, Takahiro ; Ishii, Yoshiaki..
Future Generation Computer Systems.  28 (2012)  1 - p. 78-84 , 2012
 
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14

Fabrication of three-dimensional nanoimprint mold using ino..:

Ishii, Yoshiaki ; Taniguchi, Jun
Microelectronic Engineering.  84 (2007)  5-8 - p. 912-915 , 2007
 
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15

Annealing Study on Neutron Irradiation Effects in Resonance..:

NAKATSUKA, Masafumi ; UCHIDA, Katsuya ; MIYAZAKI, Akihiro.
Journal of Nuclear Science and Technology.  44 (2007)  10 - p. 1285-1294 , 2007
 
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