Ito, Takafumi
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1

An Approach to Neutron-Induced SER Evaluation Using a Clini..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
 
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6

Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops..:

NAKAJIMA, Ryuichi ; ITO, Takafumi ; SUGITANI, Shotaro...
IEICE Transactions on Electronics.  E107.C (2024)  7 - p. 191-200 , 2024
 
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8

PM-MVS: PatchMatch multi-view stereo:

Ito, Koichi ; Ito, Takafumi ; Aoki, Takafumi
Machine Vision and Applications.  34 (2023)  2 - p. , 2023
 
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9

SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bul..:

, In: 2023 International Conference on IC Design and Technology (ICICDT),
 
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13

Zebra Body Not Caused by Fabry Disease:

Fukunaga, Shohei ; Egawa, Masahiro ; Ito, Takafumi.
Internal Medicine.  62 (2023)  22 - p. 3425-3426 , 2023
 
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