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Ivanov, Tsvetan
22  results:
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1

Charge Storage and Reliability Characteristics of Nonvolati..:

Spassov, Dencho ; Paskaleva, Albena ; Guziewicz, Elżbieta...
Materials.  15 (2022)  18 - p. 6285 , 2022
Link: https://doi.org/10.3390/..
 
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2

Scalable 1.4 μW cryo-CMOS SP4T multiplexer operating at 10 ..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Acharya, Rohith ; Potocnik, Anton ; Brebels, Steven... - p. 230-231 , 2022
Link: https://doi.org/10.1109/..
 
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3

Fabrication and room temperature characterization of trilay..:

Wan, Danny ; Couet, Sebastian ; Piao, Xiaoyu...
Japanese Journal of Applied Physics.  60 (2021)  SB - p. SBBI04 , 2021
Link: https://doi.org/10.35848..
 
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4

Amorphous Gadolinium Aluminate as a Dielectric and Sulfur f..:

van Dorp, Dennis H. ; Nyns, Laura ; Cuypers, Daniel...
ACS Applied Electronic Materials.  1 (2019)  11 - p. 2190-2201 , 2019
Link: https://doi.org/10.1021/..
 
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5

(Invited) Vertical Nanowire FET Integration and Device Aspe..:

Veloso, Anabela ; Altamirano-Sánchez, Efraín ; Brus, Stephan...
ECS Transactions.  72 (2016)  4 - p. 31-42 , 2016
Link: https://doi.org/10.1149/..
 
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6

The impact of energy barrier height on border traps in the ..:

Yoshida, Shinichi ; Taniguchi, Satoshi ; Minari, Hideki...
Japanese Journal of Applied Physics.  55 (2016)  8S2 - p. 08PC01 , 2016
Link: https://doi.org/10.7567/..
 
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7

Temperature dependence of frequency dispersion in III–V met..:

Vais, Abhitosh ; Lin, Han-Chung ; Dou, Chunmeng...
Applied Physics Letters.  107 (2015)  5 - p. , 2015
Link: https://doi.org/10.1063/..
 
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8

The influence of post-etch InGaAs fin profile on electrical..:

Ivanov, Tsvetan ; Pourghaderi, Mohammad Ali ; Lin, Dennis...
Japanese Journal of Applied Physics.  53 (2014)  4S - p. 04EC20 , 2014
Link: https://doi.org/10.7567/..
 
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9

Low temperature studies of the photoluminescence from collo..:

Valcheva, Evgenia ; Yordanov, Georgi ; Yoshimura, Hideyuki..
Colloids and Surfaces A: Physicochemical and Engineering Aspects.  461 (2014)  - p. 158-166 , 2014
Link: https://doi.org/10.1016/..
 
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10

Determination of energy and spatial distribution of oxide b..:

Dou, Chunmeng ; Lin, Dennis ; Vais, Abhitosh...
Microelectronics Reliability.  54 (2014)  4 - p. 746-754 , 2014
Link: https://doi.org/10.1016/..
 
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11

Engineering the III-V Gate Stack Properties by Optimization..:

Sioncke, Sonja ; Nyns, Laura ; Ivanov, Tsvetan...
ECS Transactions.  64 (2014)  9 - p. 133-144 , 2014
Link: https://doi.org/10.1149/..
 
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12

Overcoming I/O bottleneck in superconducting quantum comput..:

Acharya, Rohith ; Brebels, Steven ; Grill, Alexander...
http://arxiv.org/abs/2209.13060.  , 2022
Link: http://arxiv.org/abs/220..
 
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13

Millikelvin temperature cryo-CMOS multiplexer for scalable ..:

Potočnik, Anton ; Brebels, Steven ; Verjauw, Jeroen...
http://arxiv.org/abs/2011.11514.  , 2020
Link: http://arxiv.org/abs/201..
 
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14

Charge Storage and Reliability Characteristics of Nonvolati..:

Dencho Spassov ; Albena Paskaleva ; Elżbieta Guziewicz...
Electronic Materials.  , 2022
Link: https://doi.org/10.3390/..
 
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15

Charge Storage and Reliability Characteristics of Nonvolati..:

Dencho Spassov ; Albena Paskaleva ; Elżbieta Guziewicz...
https://www.mdpi.com/1996-1944/15/18/6285.  , 2022
Link: https://doi.org/10.3390/..
 
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