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Jang, Jong Shik
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1

Quantitative analysis of Si1-xGex alloy films by SIMS and X..:

Oh, Won Jin ; Jang, Jong Shik ; Lee, Youn Seoung..
Applied Surface Science.  432 (2018)  - p. 72-77 , 2018
Link: https://doi.org/10.1016/..
 
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2

Round‐robin test for the measurement of layer thickness of ..:

Kim, Kyung Joong ; Jang, Jong Shik ; Bennett, Joe...
Surface and Interface Analysis.  49 (2017)  11 - p. 1057-1063 , 2017
Link: https://doi.org/10.1002/..
 
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3

Band engineering of a Si quantum dot solar cell by modifica..:

Kwak, Gyea Young ; Lee, Seong Hyun ; Jang, Jong Shik...
Solar Energy Materials and Solar Cells.  159 (2017)  - p. 80-85 , 2017
Link: https://doi.org/10.1016/..
 
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4

Improved electrical properties of silicon quantum dot layer..:

Hong, Songwoung ; Baek, In Bok ; Kwak, Gyea Young...
Solar Energy Materials and Solar Cells.  150 (2016)  - p. 71-75 , 2016
Link: https://doi.org/10.1016/..
 
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5

SIMS study on the improvement of electrical conductivity of..:

Baek, Hyun Jeong ; Kim, Tae Woon ; Jang, Jong Shik..
Surface and Interface Analysis.  46 (2014)  S1 - p. 337-340 , 2014
Link: https://doi.org/10.1002/..
 
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6

SIMS depth profiling analysis of P‐doped n‐type Si layer to..:

Kim, Tae Woon ; Baek, Hyun Jeong ; Jang, Jong Shik..
Surface and Interface Analysis.  46 (2014)  S1 - p. 341-343 , 2014
Link: https://doi.org/10.1002/..
 
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7

Mechanism of abnormal interface artifacts in SIMS depth pro..:

Jang, Jong Shik ; Kang, Hee Jae ; Kim, Kyung Joong
Surface and Interface Analysis.  46 (2014)  S1 - p. 267-271 , 2014
Link: https://doi.org/10.1002/..
 
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8

Determination of interface locations and layer thicknesses ..:

Hwang, Hye Hyun ; Jang, Jong Shik ; Kang, Hee Jae.
Surface and Interface Analysis.  46 (2014)  S1 - p. 272-275 , 2014
Link: https://doi.org/10.1002/..
 
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9

In Situ Determination of the Pore Opening Point during Wet-..:

Han, Hee ; Park, Sang-Joon ; Jang, Jong Shik...
ACS Applied Materials & Interfaces.  5 (2013)  8 - p. 3441-3448 , 2013
Link: https://doi.org/10.1021/..
 
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10

Accurate quantification of Cu(In,Ga)Se2 films by AES depth ..:

Jang, Jong Shik ; Hwang, Hye Hyen ; Kang, Hee Jae...
Applied Surface Science.  282 (2013)  - p. 777-781 , 2013
Link: https://doi.org/10.1016/..
 
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11

Thickness measurement of a thin hetero-oxide film with an i..:

Kim, Kyung Joong ; Lee, Seung Mi ; Jang, Jong Shik.
Applied Surface Science.  258 (2012)  8 - p. 3552-3556 , 2012
Link: https://doi.org/10.1016/..
 
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12

Determination of the Absolute Thickness of Ultrathin Al2O3 ..:

Kim, Kyung Joong ; Jang, Jong Shik ; Lee, Joo-Hee..
Analytical Chemistry.  81 (2009)  20 - p. 8519-8522 , 2009
Link: https://doi.org/10.1021/..
 
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13

Highly luminescent near-infrared Cu-doped InP quantum dots ..:

Kim, Jiyong ; Choi, Hyung Seok ; Wedel, Armin...
Journal of Materials Chemistry C.  9 (2021)  12 - p. 4330-4337 , 2021
Link: https://doi.org/10.1039/..
 
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14

Embedded STT-MRAM in 28-nm FDSOI Logic Process for Industri..:

, In: 2018 IEEE Symposium on VLSI Technology,
Lee, Yong Kyu ; Jung, Hyunsung ; Lee, Kilho... - p. 181-182 , 2018
Link: https://doi.org/10.1109/..
 
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15

Selective oxidation of h2s in the presence of ammonia and w..:

Chun, Sung Woo ; Jang, Jae Yeol ; Park, Dae Won..
Korean Journal of Chemical Engineering.  14 (1997)  3 - p. 216-218 , 1997
Link: https://doi.org/10.1007/..
 
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