Jangra, Mandeep
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4

Impact of Edge and Basal Plane Oxidation on the Stability o..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Gora, Suman ; Singh, Jay ; Jangra, Mandeep. - p. P5.EM-1-P5.EM-4 , 2024
 
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8

Reliability of InGaZnO Transparent ReRAM with Optically Act..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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12

Impedance studies of free-standing, flexible thin films of ..:

Thakur, Abhishek ; Jangra, Mandeep ; Dam, Siddhartha.
Journal of Materials Science: Materials in Electronics.  33 (2022)  23 - p. 18658-18672 , 2022
 
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