Jen, Wesley
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1

Atomic Layer Processing of MoS2:

, In: 2023 IEEE Workshop on Microelectronics and Electron Devices (WMED),
Jen, Wesley ; Hues, John D. ; Soares, Jake... - p. 1-3 , 2023
 
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Metallic 1T phase source/drain electrodes for field effect ..:

Kappera, Rajesh ; Voiry, Damien ; Yalcin, Sibel Ebru...
Kappera, Rajesh, Voiry, Damien, Yalcin, Sibel Ebru, et al. "Metallic 1T phase source/drain electrodes for field effect transistors from chemical vapor deposited MoS2." APL Materials, 2, (2014) AIP: 92516. http://dx.doi.org/10.1063/1.4896077..  , 2014
 
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A Synthesis of Findings from 'Rapid Assessments' of Disabil..:

Hillgrove, Tessa ; Blyth, Jen ; Kiefel-Johnson, Felix.
International Journal of Environmental Research and Public Health.  18 (2021)  18 - p. 9701 , 2021
 
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Advanced Inspection Methodology for the Maximum Extension o..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ke, Yu-Yuan ; Chen, Kuang-Hsiu ; Chen, Shin-Ru... - p. 1-5 , 2020
 
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