E-LIB Suche - Ergebnisse für: Jeon, Byung-Chul

1

A New 1200 V Punch Through-Insulated Gate Bipolar Transisto..:

Ji, In-Hwan ; Choi, Young-Hwan ; Jeon, Byung-Chul...
Japanese Journal of Applied Physics. 46 (2007) 4S - p. 2037 , 2007

Link: https://doi.org/10.1143/..

2

A New Protective Circuit to Improve Short-Circuit Withstand..:

Choi, Young-Hwan ; Ji, In-Hwan ; Jeon, Byung-Chul..
Japanese Journal of Applied Physics. 45 (2006) 4S - p. 3317 , 2006

Link: https://doi.org/10.1143/..

3

A New 600 V Punch Through-Insulated Gate Bipolar Transistor..:

Ji, In-Hwan ; Jeon, Byung-Chul ; Choi, Young-Hwan..
Japanese Journal of Applied Physics. 45 (2006) 10R - p. 7587 , 2006

Link: https://doi.org/10.1143/..

4

A New Emitter Switched Thyristor (EST) employing Trench Seg..:

Ji, In-Hwan ; Jeon, Byung-Chul ; Choi, Young-Hwan..
Microelectronics Journal. 37 (2006) 3 - p. 231-235 , 2006

Link: https://doi.org/10.1016/..

5

A New Voltage between Collector and Emitter (VCE) Sensing S..:

Jeon, Byung-Chul ; Ji, In-hwan ; Ha, Min-Woo..
Japanese Journal of Applied Physics. 43 (2004) 4S - p. 1677 , 2004

Link: https://doi.org/10.1143/..

6

A New Conductivity Modulated LDMOSFET Employing Buried P Re..:

Oh, Jae-Keun ; Ha, Min-Woo ; Jeon, Byung-Chul..
Japanese Journal of Applied Physics. 43 (2004) 10 - p. 6917-6919 , 2004

Link: https://doi.org/10.1143/..

7

Second Breakdown of 18V Grounded Gate NMOS induced by the K..:

Jeon, Byung-Chul ; Lee, Seung-Chul ; Han, Min-Koo
Japanese Journal of Applied Physics. 42 (2003) Part 1, No. 9A - p. 5516-5520 , 2003

Link: https://doi.org/10.1143/..

8

Optimal vibration image size determination for convolutiona..:

Jeon, Byung Chul ; Jung, Joon Ha ; Kim, Myungyon..
Journal of Mechanical Science and Technology. 34 (2020) 4 - p. 1467-1474 , 2020

Link: https://doi.org/10.1007/..

9

Hybrid Approach of Data-Driven and Physics-based Methods fo..:

Kong, Hyeon Bae ; Jo, Soo-Ho ; Jung, Joon Ha...
Annual Conference of the PHM Society. 11 (2019) 1 - p. , 2019

Link: https://doi.org/10.36001..

10

Omnidirectional regeneration (ODR) of proximity sensor sign..:

Jung, Joon Ha ; Jeon, Byung Chul ; Youn, Byeng D....
Mechanical Systems and Signal Processing. 90 (2017) - p. 189-207 , 2017

Link: https://doi.org/10.1016/..

11

Erratum to: Datum unit optimization for robustness of a jou..:

Jeon, Byung Chul ; Jung, Joon Ha ; Youn, Byeng Dong..
International Journal of Precision Engineering and Manufacturing. 17 (2016) 1 - p. 151-151 , 2016

Link: https://doi.org/10.1007/..

12

Datum unit optimization for robustness of a journal bearing..:

Jeon, Byung Chul ; Jung, Joon Ha ; Youn, Byeng Dong..
International Journal of Precision Engineering and Manufacturing. 16 (2015) 11 - p. 2411-2425 , 2015

Link: https://doi.org/10.1007/..

13

Effect of deposition temperature on the formation of defect..:

Jeon, Byung Chul ; Chae, Seung Chul ; Kang, Tae Dong.
Journal of the Korean Physical Society. 64 (2014) 12 - p. 1849-1853 , 2014

Link: https://doi.org/10.3938/..

14

Flexoelectric Control of Defect Formation in Ferroelectric ..:

Lee, Daesu ; Jeon, Byung Chul ; Yoon, Aram...
Advanced Materials. 26 (2014) 29 - p. 5005-5011 , 2014

Link: https://doi.org/10.1002/..

15

Flexoelectric Effect in the Reversal of Self‐Polarization a..:

Jeon, Byung Chul ; Lee, Daesu ; Lee, Myang Hwan...
Advanced Materials. 25 (2013) 39 - p. 5643-5649 , 2013

Link: https://doi.org/10.1002/..