Jeong, Hanwool
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1

High Efficiency Variation-Aware SRAM Timing Characterizatio..:

Jeon, Inseong ; Park, Hyunho ; Yoon, Taehwan.
IEEE Transactions on Circuits and Systems II: Express Briefs.  71 (2024)  3 - p. 1391-1395 , 2024
 
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2

Energy-Efficient Wide-Range Level Shifter With a Logic Erro..:

Park, Jihwan ; Jeong, Hanwool
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  5 - p. 701-705 , 2023
 
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3

Bayesian Learning Automated SRAM Circuit Design for Power a..:

Lee, Junseo ; Park, Jihwan ; Kim, Seokhun.
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  12 - p. 4949-4961 , 2023
 
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4

Machine Learning-Based Read Access Yield Estimation and Des..:

Yoon, Taehwan ; Jeong, Hanwool
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  8 - p. 2618-2630 , 2023
 
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6

Cross-Coupled nFET Preamplifier for Low Voltage SRAM:

Lee, Sangheon ; Park, Jaehyun ; Jeong, Hanwool
IEEE Transactions on Circuits and Systems II: Express Briefs.  70 (2023)  9 - p. 3604-3608 , 2023
 
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7

Voltage Boosted Fail Detecting Circuit for Selective Write ..:

Park, Jaehyun ; Lee, Sangheon ; Jeong, Hanwool
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  2 - p. 797-805 , 2023
 
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9

Self-Shut-Off Pulsed Latches for Minimizing Sequencing Over..:

Park, Hyunho ; Jeong, Hanwool
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  30 (2022)  11 - p. 1728-1738 , 2022
 
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11

All-Digital Time-Domain Temperature Sensor for Energy Effic..:

, In: 2022 International Conference on Electronics, Information, and Communication (ICEIC),
Baek, Gidong ; Jeong, Hanwool - p. 1-4 , 2022
 
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14

Sense-Amplifier-Based Flip-Flop With Transition Completion ..:

Jeong, Hanwool ; Oh, Tae Woo ; Song, Seung Chul.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  26 (2018)  4 - p. 609-620 , 2018
 
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15

Power-Gated 9T SRAM Cell for Low-Energy Operation:

Oh, Tae Woo ; Jeong, Hanwool ; Kang, Kyoman...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  3 - p. 1183-1187 , 2017
 
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