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Jeong, Kwang-Seok
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1

Current–voltage and low-frequency noise analysis of heteroj..:

Ko, Young-Uk ; Yun, Ho-Jin ; Jeong, Kwang-Seok...
Thin Solid Films.  598 (2016)  - p. 109-114 , 2016
Link: https://doi.org/10.1016/..
 
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2

Changes of fish assemblages after construction of an estuar..:

Yoon, Ju-Duk ; Jang, Min-Ho ; Jo, Hyun-Bin...
Limnology.  17 (2016)  2 - p. 183-197 , 2016
Link: https://doi.org/10.1007/..
 
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3

Origin of Oxygen-Induced Abnormal Hump in Bottom-Gated Poly..:

Jeong, Kwang-Seok ; Kim, Yu-Mi ; Lee, Ga-Won
ECS Journal of Solid State Science and Technology.  4 (2015)  5 - p. Q31-Q34 , 2015
Link: https://doi.org/10.1149/..
 
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4

Novel silicon surface passivation by Al2O3/ZnO/Al2O3 films ..:

Jeong, Kwang-Seok ; Oh, Sung-Kwen ; Shin, Hong-Sik...
Japanese Journal of Applied Physics.  53 (2014)  4S - p. 04ER19 , 2014
Link: https://doi.org/10.7567/..
 
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5

Effect of surface pretreatment in the thermal atomic layer ..:

Li, Meng ; Shin, Hong-Sik ; Jeong, Kwang-Seok...
Japanese Journal of Applied Physics.  53 (2014)  8S1 - p. 08LC04 , 2014
Link: https://doi.org/10.7567/..
 
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6

Channel engineering of ZnO-based thin film transistors usin..:

Kim, Seong-Hyeon ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  53 (2014)  9 - p. 091101 , 2014
Link: https://doi.org/10.7567/..
 
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7

Analysis of stability improvement in ZnO thin film transist..:

Yun, Ho-Jin ; Kim, Young-Su ; Jeong, Kwang-Seok...
Japanese Journal of Applied Physics.  53 (2014)  4S - p. 04EF11 , 2014
Link: https://doi.org/10.7567/..
 
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8

Characterization of polycrystalline silicon-oxide-nitride-o..:

Lee, Sang-Youl ; Oh, Jae-Sub ; Yang, Seung-Dong...
Electronic Materials Letters.  9 (2013)  S1 - p. 23-27 , 2013
Link: https://doi.org/10.1007/..
 
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9

Investigation of the instability of low-temperature poly-si..:

Kim, Yu-Mi ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Electronic Materials Letters.  9 (2013)  S1 - p. 13-16 , 2013
Link: https://doi.org/10.1007/..
 
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10

Investigation of the Gate Bias Stress Instability in ZnO Th..:

Jeong, Kwang-Seok ; Yun, Ho-Jin ; Kim, Yu-Mi...
Japanese Journal of Applied Physics.  52 (2013)  4S - p. 04CF04 , 2013
Link: https://doi.org/10.7567/..
 
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11

Investigation of zinc interstitial ions as the origin of an..:

Kim, Yu-Mi ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Applied Physics Letters.  102 (2013)  17 - p. , 2013
Link: https://doi.org/10.1063/..
 
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12

Comparative Analysis of Bandgap-Engineered Pillar Type Flas..:

LEE, Sang-Youl ; YANG, Seung-Dong ; OH, Jae-Sub...
IEICE Transactions on Electronics.  E95.C (2012)  5 - p. 831-836 , 2012
Link: https://doi.org/10.1587/..
 
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13

Electrical Characteristic Analysis of Postannealed ZnO Thin..:

Jeong, Kwang-Seok ; Kim, Yu-Mi ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  51 (2012)  9S2 - p. 09MF09 , 2012
Link: https://doi.org/10.7567/..
 
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14

Electrical Characteristic Analysis of Postannealed ZnO Thin..:

Jeong, Kwang-Seok ; Kim, Yu-Mi ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  51 (2012)  9S2 - p. 09MF09 , 2012
Link: https://doi.org/10.1143/..
 
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15

Electrical Instabilities in Amorphous InGaZnO Thin Film Tra..:

Kim, Yu-Mi ; Jeong, Kwang-Seok ; Yun, Ho-Jin...
Japanese Journal of Applied Physics.  51 (2012)  9S2 - p. 09MF10 , 2012
Link: https://doi.org/10.7567/..
 
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