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Ji, In-Hwan
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1

High Temperature and High Humidity Reliability Evaluation o..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Ji, In-Hwan ; Mathew, Anoop ; Park, Jae-Hyung... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

Erratum: "Temperature dependence of avalanche breakdown in ..:

Steinmann, Philipp ; Hull, Brett ; Ji, In-Hwan..
Journal of Applied Physics.  134 (2023)  23 - p. , 2023
Link: https://doi.org/10.1063/..
 
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3

Temperature dependence of avalanche breakdown in 4H-SiC dev..:

Steinmann, Philipp ; Hull, Brett ; Ji, In-Hwan..
Journal of Applied Physics.  133 (2023)  23 - p. , 2023
Link: https://doi.org/10.1063/..
 
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4

High voltage AlGaN/GaN HFET employing low taper angle field..:

, In: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD),
Ji, In-Hwan ; Lee, Bongmook ; Wang, Sizhen... - p. 269-272 , 2014
Link: https://doi.org/10.1109/..
 
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5

A new fault current-sensing scheme for fast fault protectio..:

Ji, In-Hwan ; Ha, Min-Woo ; Choi, Young-Hwan...
Microelectronics Journal.  39 (2008)  6 - p. 908-913 , 2008
Link: https://doi.org/10.1016/..
 
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6

A New 1200 V Punch Through-Insulated Gate Bipolar Transisto..:

Ji, In-Hwan ; Choi, Young-Hwan ; Jeon, Byung-Chul...
Japanese Journal of Applied Physics.  46 (2007)  4S - p. 2037 , 2007
Link: https://doi.org/10.1143/..
 
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7

A New Silicon-on-Insulator Lateral Insulated Gate Bipolar T..:

Ji, In-Hwan ; Choi, Young-Hwan ; Ha, Min-Woo.
Japanese Journal of Applied Physics.  46 (2007)  4S - p. 2041 , 2007
Link: https://doi.org/10.1143/..
 
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8

An Improved Junction Termination Design Employing Shallow T..:

Ha, Min-Woo ; Lee, Seung-Chul ; Choi, Young-Hwan..
Japanese Journal of Applied Physics.  45 (2006)  2R - p. 626 , 2006
Link: https://doi.org/10.1143/..
 
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9

A New Protective Circuit to Improve Short-Circuit Withstand..:

Choi, Young-Hwan ; Ji, In-Hwan ; Jeon, Byung-Chul..
Japanese Journal of Applied Physics.  45 (2006)  4S - p. 3317 , 2006
Link: https://doi.org/10.1143/..
 
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10

The Geometry Effect of A Counter-Doped Lateral Body Termina..:

Han, Sang-Myeon ; Ji, In-Hwan ; Park, Joon-Hyun...
ECS Transactions.  3 (2006)  8 - p. 137-142 , 2006
Link: https://doi.org/10.1149/..
 
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11

A New 600 V Punch Through-Insulated Gate Bipolar Transistor..:

Ji, In-Hwan ; Jeon, Byung-Chul ; Choi, Young-Hwan..
Japanese Journal of Applied Physics.  45 (2006)  10R - p. 7587 , 2006
Link: https://doi.org/10.1143/..
 
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12

Experimental Study on Improving Unclamped Inductive Switchi..:

Ji, In-Hwan ; Choi, Young-Hwan ; Kim, Soo-Seong..
Japanese Journal of Applied Physics.  45 (2006)  4S - p. 3121 , 2006
Link: https://doi.org/10.1143/..
 
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13

A New Emitter Switched Thyristor (EST) employing Trench Seg..:

Ji, In-Hwan ; Jeon, Byung-Chul ; Choi, Young-Hwan..
Microelectronics Journal.  37 (2006)  3 - p. 231-235 , 2006
Link: https://doi.org/10.1016/..
 
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14

A New Voltage between Collector and Emitter (VCE) Sensing S..:

Jeon, Byung-Chul ; Ji, In-hwan ; Ha, Min-Woo..
Japanese Journal of Applied Physics.  43 (2004)  4S - p. 1677 , 2004
Link: https://doi.org/10.1143/..
 
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15

Skin microbe-dependent TSLP-ILC2 priming axis in early life..:

Cha, Jimin ; Kim, Tae-Gyun ; Bhae, Euihyun...
Cell Host & Microbe.  32 (2024)  2 - p. 244-260.e11 , 2024
Link: https://doi.org/10.1016/..
 
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