Jia, Wei-nan
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2

Impact of Ge profiles on neutron-induced displacement damag..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Wei, Jia-Nan ; Fu, Xiao-Jun ; Du, Xiang... - p. 1-3 , 2022
 
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3

Impact of layout and profile optimization for inverse-mode ..:

Wei, Jia-Nan ; He, Chao-Hui ; Li, Pei..
Microelectronics Reliability.  105 (2020)  - p. 113561 , 2020
 
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Simulation of substrate contact effects on heavy ion-induce..:

Wei, Jia-nan ; He, Chao-hui ; Li, Pei..
Microelectronics Reliability.  95 (2019)  - p. 28-35 , 2019
 
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Impact of displacement damage on single event transient cha..:

Wei, Jia-nan ; He, Chao-hui ; Li, Pei..
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  938 (2019)  - p. 29-35 , 2019
 
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7

Analysis of SEE modes in ferroelectric random access memory..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Wei, Jia-Nan ; Guo, Hong-Xia ; Zhang, Feng-Qi.. - p. 1-5 , 2019
 
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Research of X-ray induced single event soft errors in 45 nm..:

Zhang, Yang ; Guo, Hong-Xia ; Zhang, Feng-Qi...
Japanese Journal of Applied Physics.  58 (2018)  1 - p. 011002 , 2018
 
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Analysis and prediction of improved SEIR transmission dynam..:

Lu, Ming ; Zheng, Xu-yang ; Jia, Wei-nan.
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10484606/.  , 2023
 
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