Johll, Harman
7  results:
Search for persons X
?
1

Spatially Mapping Work Function Changes and Defect Evolutio..:

, In: 2019 IEEE 9th International Nanoelectronics Conferences (INEC),
Ong, Bin Leong ; Ong, Sheau Wei ; Liu, Bo... - p. 1-6 , 2019
 
1-7