E-LIB Suche - Ergebnisse für: Johnson, Keir G.

1

Medicaid Expansion Is Associated With Increases in Medicaid..:

Homer, Alexander S. ; Johnson, Keir G. ; Alsoof, Daniel..
The Journal of Arthroplasty. 39 (2024) 2 - p. 300-306.e3 , 2024

Link: https://doi.org/10.1016/..

2

Underweight Patients are at Increased Risk for Complication..:

McDonald, Christopher L. ; Alsoof, Daniel ; Johnson, Keir G....
The Journal of Arthroplasty. 38 (2023) 8 - p. 1559-1564.e1 , 2023

Link: https://doi.org/10.1016/..

3

Malnutrition, Body Mass Index, and Associated Risk of Compl..:

Johnson, Keir G. ; Alsoof, Daniel ; McDonald, Christopher L....
World Neurosurgery. 163 (2022) - p. e89-e97 , 2022

Link: https://doi.org/10.1016/..

4

Crystallographic characterisation of novel Zn(II) silsesqui..:

Jones, Matthew D. ; Keir, Callum G. ; Johnson, Andrew L..
Polyhedron. 29 (2010) 1 - p. 312-316 , 2010

Link: https://doi.org/10.1016/..

5

A case of the carbohydrate‐deficient glycoprotein syndrome ..:

Charlwood, J. ; Clayton, P. ; Johnson, A....
Journal of Inherited Metabolic Disease. 20 (1997) 6 - p. 817-827 , 1997

Link: https://doi.org/10.1023/..

6

A rapid method for detecting oligoclonal IgG in unconcentra..:

Walker, R.W.H. ; Keir, G. ; Johnson, M.H..
Journal of Neuroimmunology. 4 (1983) 2 - p. 141-148 , 1983

Link: https://doi.org/10.1016/..

7

Nitrocellulose immunofixation following agarose electrophor..:

Keir, G. ; Walker, R.W.H. ; Johnson, M.H..
Clinica Chimica Acta. 121 (1982) 2 - p. 231-236 , 1982

Link: https://doi.org/10.1016/..

8

X-ray optics ofin situsynchrotron topography of InGaAs on G..:

Tanner, B K ; Keir, A M ; Möck, P...
Journal of Physics D: Applied Physics. 32 (1999) 10A - p. A119-A122 , 1999

Link: https://doi.org/10.1088/..

9

In-situ direct measurement of activation energies for the g..:

Lacey, G. ; Whitehouse, C.R. ; Parbrook, P.J....
Applied Surface Science. 123-124 (1998) - p. 718-724 , 1998

Link: https://doi.org/10.1016/..

10

Determination of the critical thickness of misfit dislocati..:

Möck, P ; Tanner, B K ; Li, C R...
Semiconductor Science and Technology. 11 (1996) 7 - p. 1051-1055 , 1996

Link: https://doi.org/10.1088/..

11

Determination of the critical thickness of misfit dislocati..:

Möck, P ; Tanner, B K ; Li, C R...
Semiconductor Science and Technology. 11 (1996) 9 - p. 1363-1363 , 1996

Link: https://doi.org/10.1088/..

12

In-situ X-ray imaging of III–V strained-layer relaxation pr..:

Whitehouse, C.R. ; Cullis, A.G. ; Barnett, S.J....
Journal of Crystal Growth. 150 (1995) - p. 85-91 , 1995

Link: https://doi.org/10.1016/..

13

In situ X-ray topography studies during the molecular beam ..:

Barnett, S J ; Keir, A M ; Cullis, A G...
Journal of Physics D: Applied Physics. 28 (1995) 4A - p. A17-A22 , 1995

Link: https://doi.org/10.1088/..

14

X-ray topography of lattice relaxation in strained layer se..:

Barnett, S J ; Whitehouse, C R ; Keir, A M...
Journal of Physics D: Applied Physics. 26 (1993) 4A - p. A45-A49 , 1993

Link: https://doi.org/10.1088/..

15

Simulation of X-ray reflection topographs from misfit dislo..:

Spirkl, W. ; Tanner, B. K. ; Whitehouse, C....
Philosophical Magazine A. 69 (1994) 1 - p. 221-236 , 1994

Link: https://doi.org/10.1080/..