Jokubavicius, V.
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3

Nucleation and growth of polycrystalline SiC:

Kaiser, M ; Schimmel, S ; Jokubavicius, V...
IOP Conference Series: Materials Science and Engineering.  56 (2014)  - p. 012001 , 2014
 
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4

Temperature Dependencies of Free-Carrier-Absorption Lifetim..:

Manolis, G ; Gulbinas, K ; Grivickas, V...
IOP Conference Series: Materials Science and Engineering.  56 (2014)  - p. 012006 , 2014
 
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5

Carrier Lifetimes and Influence of In-Grown Defects in N-B ..:

Grivickas, V ; Gulbinas, K ; Jokubavičius, V...
IOP Conference Series: Materials Science and Engineering.  56 (2014)  - p. 012004 , 2014
 
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6

Examination of Photoluminescence Temperature Dependencies i..:

Gavryushin, V ; Gulbinas, K ; Grivickas, V...
IOP Conference Series: Materials Science and Engineering.  56 (2014)  - p. 012003 , 2014
 
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7

The role of defects in fluorescent silicon carbide layers g..:

Schimmel, S ; Kaiser, M ; Jokubavicius, V...
IOP Conference Series: Materials Science and Engineering.  56 (2014)  - p. 012002 , 2014
 
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9

Raman Scattering and Carrier Diffusion Study in Heavily Co-..:

Gulbinas, K ; Ščajev, P ; Bikbajavas, V...
IOP Conference Series: Materials Science and Engineering.  56 (2014)  - p. 012005 , 2014
 
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12

Shockley-Frank stacking faults in 6H-SiC:

Sun, J. W. ; Robert, T. ; Andreadou, A....
Journal of Applied Physics.  111 (2012)  11 - p. , 2012
 
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13

Fluorescent silicon carbide as an ultraviolet-to-visible li..:

Sun, J W ; Kamiyama, S ; Jokubavicius, V...
Journal of Physics D: Applied Physics.  45 (2012)  23 - p. 235107 , 2012
 
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14

Characterization of deep level defects in sublimation grown..:

Asghar, M. ; Iqbal, F. ; Faraz, S....
Physica B: Condensed Matter.  407 (2012)  15 - p. 3041-3043 , 2012
 
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