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Jone, Wen-Ben
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1

SERA: statistical error rate analysis for profit-oriented p..:

Han, Qiang ; Xu, Qiang ; Jone, Wen-Ben
Integration.  60 (2018)  - p. 1-12 , 2018
Link: https://doi.org/10.1016/..
 
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2

Leak Stopper : An Actively Revitalized Snoop Filter Arch..:

Peng, Yin-Chi ; Chen, Chien-Chih ; Tsai, Hsiang-Jen...
ACM Transactions on Design Automation of Electronic Systems (TODAES).  22 (2017)  3 - p. 1-27 , 2017
Link: https://dl.acm.org/doi/1..
 
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3

Leak Stopper: An Actively Revitalized Snoop Filter Architec..:

Peng, Yin-Chi ; Chen, Chien-Chih ; Tsai, Hsiang-Jen...
ACM Transactions on Design Automation of Electronic Systems.  22 (2017)  3 - p. 1-27 , 2017
Link: https://doi.org/10.1145/..
 
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4

High-Performance Deadlock-Free ID Assignment for Advanced I..:

Chou, Hsuan-Ming ; Chen, Yi-Chiao ; Yang, Keng-Hao...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  24 (2016)  3 - p. 1169-1173 , 2016
Link: https://doi.org/10.1109/..
 
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5

Soft-Error-Tolerant Design Methodology for Balancing Perfor..:

Chou, Hsuan-Ming ; Hsiao, Ming-Yi ; Chen, Yi-Chiao...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  23 (2015)  9 - p. 1628-1639 , 2015
Link: https://doi.org/10.1109/..
 
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6

On Resilient System Performance Binning:

, In: Proceedings of the 2015 Symposium on International Symposium on Physical Design,
Han, Qiang ; Guo, Jianghao ; Xu, Qiang. - p. 119-125 , 2015
Link: https://dl.acm.org/doi/1..
 
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7

On macro-fault : a new fault model, its implications on ..:

, In: Proceedings of the 24th edition of the great lakes symposium on VLSI,
Lam, Tak-Kei ; Wei, Xing ; Jone, Wen-Ben.. - p. 233-234 , 2014
Link: https://dl.acm.org/doi/1..
 
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8

On testing timing-speculative circuits:

, In: Proceedings of the 50th Annual Design Automation Conference,
Yuan, Feng ; Liu, Yannan ; Jone, Wen-Ben. - p. 1-6 , 2013
Link: https://dl.acm.org/doi/1..
 
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9

Post-placement voltage island generation for timing-specula..:

, In: Proceedings of the 50th Annual Design Automation Conference,
Ye, Rong ; Yuan, Feng ; Sun, Zelong.. - p. 1-6 , 2013
Link: https://dl.acm.org/doi/1..
 
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10

Testing of Synchronizers in Asynchronous FIFO:

Kim, Hyoung-Kook ; Wang, Laung-Terng ; Wu, Yu-Liang.
Journal of Electronic Testing.  29 (2013)  1 - p. 49-72 , 2013
Link: https://doi.org/10.1007/..
 
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11

Launch-on-Shift Test Generation for Testing Scan Designs Co..:

Wu, Shianling ; Wang, Laung-Terng ; Wen, Xiaoqing...
ACM Transactions on Design Automation of Electronic Systems.  17 (2012)  4 - p. 1-16 , 2012
Link: https://doi.org/10.1145/..
 
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12

Launch-on-Shift Test Generation for Testing Scan Designs Co..:

Wu, Shianling ; Wang, Laung-Terng ; Wen, Xiaoqing...
ACM Transactions on Design Automation of Electronic Systems (TODAES).  17 (2012)  4 - p. 1-16 , 2012
Link: https://dl.acm.org/doi/1..
 
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13

Dynamic Characteristics of Power Gating During Mode Transit..:

Xu, Hao ; Vemuri, Ranga ; Jone, Wen-Ben
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  19 (2011)  2 - p. 237-249 , 2011
Link: https://doi.org/10.1109/..
 
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14

Location Cache Design and Performance Analysis for Chip Mul..:

Nemeth, Jason ; Min, Rui ; Jone, Wen-Ben.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  19 (2011)  1 - p. 104-117 , 2011
Link: https://doi.org/10.1109/..
 
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15

Aggressive Runtime Leakage Control Through Adaptive Light-W..:

Xu, Hao ; Jone, Wen-Ben ; Vemuri, Ranga
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  19 (2011)  7 - p. 1319-1323 , 2011
Link: https://doi.org/10.1109/..
 
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