Search for persons
X
?
2006 IEEE Nanotechnology Materials and Devices Conference ,
2
Breakdown voltage reduction in I-MOS devices:
, In:
?
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ,
3
70-nm impact-ionization metal-oxide-semiconductor (I-MOS) d..:
, In:
?
2005 International Semiconductor Device Research Symposium ,
4
25nm Programmable Virtual Source/Drain MOSFETs Using a Twin..:
, In:
?
Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC. ,
6
Nano-scale MOSFETs with programmable virtual source/drain:
, In:
?
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) ,
7
Programmable virtual source/drain MOSFETs:
, In:
?
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. ,
9
80nm self-aligned complementary I-MOS using double sidewall..:
, In:
?
Conference Digest [Includes 'Late News Papers' volume] Device Research Conference, 2004. 62nd DRC. ,
11
A new fabrication method for self-aligned nanoscale I-MOS (..:
, In:
?
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) ,
12
A new linearity measurement algorithm for sub-micron microw..:
, In:
?
Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003. ISLPED '03. ,
13
Reverse-order source/drain formation with double offset spa..:
, In:
?
ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575) ,
14