E-LIB Suche - Ergebnisse für: Joshi, Vipin

1

Physical Insights Into the Lattice Temperature Dependent Ev..:

Roy Chaudhuri, Rajarshi ; Joshi, Vipin ; Malik, Rasik Rashid.
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1633-1640 , 2024

Link: https://doi.org/10.1109/..

2

Experimental Insights into the Role of Inter-valley and Def..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Chaudhuri, Rajarshi Roy ; Joshi, Vipin ; Wani, Saniya S.... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

3

Physical Insights Into Electron Trapping Mechanism in the C..:

Joshi, Vipin ; Roy Chaudhuri, Rajarshi ; Dutta Gupta, Sayak.
IEEE Transactions on Electron Devices. 70 (2023) 6 - p. 3011-3018 , 2023

Link: https://doi.org/10.1109/..

4

Impact of Channel Electric Field Profile Evolution on Nanos..:

Chaudhuri, Rajarshi Roy ; Gupta, Amratansh ; Joshi, Vipin...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6183-6189 , 2023

Link: https://doi.org/10.1109/..

5

Signatures of Positive Gate Over-Drive Induced Hole Trap Ge..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Malik, Rasik Rashid ; Joshi, Vipin ; Chaudhuri, Rajarshi Roy... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

6

Physical Insights into the DC and Transient Reverse Bias Re..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Raj, Harsh ; Joshi, Vipin ; Chaudhuri, Rajarshi Roy.. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

7

Dynamic Interplay of Surface and Buffer Traps in Determinin..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Mir, Mehak Ashraf ; Joshi, Vipin ; Chaudhuri, Rajarshi Roy... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

8

Understanding Temperature Dependence of ESD Reliability in ..:

, In: 2023 45th Annual EOS/ESD Symposium (EOS/ESD),

Munshi, Mohammad Ateeb ; Ashraf Mir, Mehak ; Malik, Rasik... - p. 1-5 , 2023

Link: https://doi.org/10.23919..

9

Unique Lattice Temperature Dependent Evolution of Hot Elect..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Chaudhuri, Rajarshi Roy ; Joshi, Vipin ; Gupta, Amratansh... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

10

Interplay of Surface Passivation and Electric Field in Dete..:

, In: 2023 45th Annual EOS/ESD Symposium (EOS/ESD),

Malik, Rasik Rashid ; Shaji, Avinas N ; Jayshree... - p. 1-7 , 2023

Link: https://doi.org/10.23919..

11

Impact of Buffer Capacitance-Induced Trap Charging on Elect..:

Joshi, Vipin ; Roy Chaudhuri, Rajarshi ; Dutta Gupta, Sayak.
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6465-6472 , 2023

Link: https://doi.org/10.1109/..

12

Unique Dependence of the Breakdown Behavior of Normally-OFF..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Joshi, Vipin ; Gupta, Sayak Dutta ; Chaudhuri, Rajarshi Roy. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

13

Physical Insights Into Nano-Second Time Scale Cyclic Stress..:

Roy Chaudhuri, Rajarshi ; Gupta, Amratansh ; Joshi, Vipin...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6175-6182 , 2023

Link: https://doi.org/10.1109/..

14

Reverse Bias Stress-Induced Turn-On Voltage Shift in Recess..:

Malik, Rasik Rashid ; Joshi, Vipin ; Chaudhuri, Rajarshi Roy..
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6211-6216 , 2023

Link: https://doi.org/10.1109/..

15

Interplay of Device Design and Carbon-Doped GaN Buffer Para..:

Joshi, Vipin ; Gupta, Sayak Dutta ; Chaudhuri, Rajarshi Roy.
IEEE Transactions on Electron Devices. 69 (2022) 11 - p. 6035-6042 , 2022

Link: https://doi.org/10.1109/..