Jowett, Charles Eric
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2

Semiconductor devices 

testing and evaluation 
Copies:  Zentrale: a elt 660/475
 
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Guest editorial:

Jowett, Charles E.
Microelectronics Reliability.  26 (1986)  3 - p. 415 , 1986
 
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Reliability in the electronics manufacturing phase:

Jowett, Charles
Microelectronics Reliability.  15 (1976)  6 - p. 595-600 , 1976
 
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Plasma Levels of Soluble Interleukin 1 Receptor Accessory P..:

Bozaoglu, Kiymet ; Attard, Chantal ; Kulkarni, Hemant...
The Journal of Clinical Endocrinology & Metabolism.  99 (2014)  9 - p. 3435-3443 , 2014
 
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15

Genotype×age interaction in human transcriptional ageing:

Kent Jr., Jack W. ; Göring, Harald H.H. ; Charlesworth, Jac C....
Mechanisms of Ageing and Development.  133 (2012)  9-10 - p. 581-590 , 2012
 
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