Joy, D. C.
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1

Better safe than so ray: national survey of radiation prote..:

Patel, S ; Jenkins, P ; Zhong, J...
The British Journal of Radiology.  96 (2023)  1149 - p. , 2023
 
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2

The Joy in imaging the Auger Electron Signal in a FESEM usi..:

Griffin, B.J. ; Suvorova, A.A. ; Joy, D.C..
Microscopy and Microanalysis.  24 (2018)  S1 - p. 620-621 , 2018
 
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3

Improved Z-axis Resolution in Serial Block Face SEM with Du..:

He, Q. ; Joy, D.C. ; Zhang, G..
Microscopy and Microanalysis.  24 (2018)  S1 - p. 1440-1441 , 2018
 
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Is It Possible to Image the Auger Electron Signal in a Conv..:

Griffin, B.J. ; Suvorova, A.A. ; Joy, D.C..
Microscopy and Microanalysis.  22 (2016)  S3 - p. 606-607 , 2016
 
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9

Sub-surface Serial Block Face Scanning Electron Microscopy:

He, Q. ; Aronova, M.A. ; Joy, D.C...
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1267-1268 , 2015
 
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10

Investigation of Image Contrast of Energy-Filtered BSE Imag..:

Hashimoto, Y. ; Muto, A. ; Walters, T...
Microscopy and Microanalysis.  21 (2015)  S3 - p. 837-838 , 2015
 
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11

Variation in Band Gap Contrast in Natural Molybdenum Disulp..:

Griffin, B.J. ; Joy, D.C. ; Michael, J.R.
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1107-1108 , 2015
 
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12

Modeling Ion Beam Induced Secondary Electrons:

Huh, U. ; Iberi, V. ; Cho, W...
Microscopy and Microanalysis.  21 (2015)  S3 - p. 1689-1690 , 2015
 
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13

Oliver Wells (1931-2013) A Brief Memorial:

Joy, D. C. ; Gignac, L.
Microscopy and Microanalysis.  20 (2014)  S3 - p. 2-3 , 2014
 
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Monte Carlo Modeling of Ion Beam Induced Secondary Electron:

Huh, U. ; Cho, W. ; Ramachandra, R..
Microscopy and Microanalysis.  20 (2014)  S3 - p. 302-303 , 2014
 
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