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2024 IEEE International Reliability Physics Symposium (IRPS) ,
4
A Comprehensive Study of Read-After-Write-Delay for Ferroel..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
6
Drain Current Degradation Induced by Charge Trapping/De-Tra..:
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2023 International Electron Devices Meeting (IEDM) ,
9