E-LIB Suche - Ergebnisse für: Kämpfe, Thomas

1

Towards wake-up free ferroelectrics and scaling: Al-doped H..:

Sünbül, Ayse ; Lehninger, David ; Pourjafar, Amir...
Memories - Materials, Devices, Circuits and Systems. 8 (2024) - p. 100110 , 2024

Link: https://doi.org/10.1016/..

2

Adaptive Mixed MLC-SLC FeFET Mapping for CIM AI Application..:

, In: 2024 IEEE 6th International Conference on AI Circuits and Systems (AICAS),

Vardar, Alptekin ; Muller, Franz ; Gecin, Ipek.. - p. 258-262 , 2024

Link: https://doi.org/10.1109/..

3

Design and Characterization of a Variable Gain D-Band LNA f..:

Artz, Patrick James ; Huy Le, Quang ; Huynh, Dang Khoa...
IEEE Transactions on Microwave Theory and Techniques. 72 (2024) 2 - p. 1008-1017 , 2024

Link: https://doi.org/10.1109/..

4

Single Slope ADC with Reset Counting for FeFET-based In-Mem..:

, In: 2024 IEEE International Symposium on Circuits and Systems (ISCAS),

Laleni, Nellie ; Padma, Sahana ; Kampfe, Thomas. - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

5

Ferroelectric compute-in-memory annealer for combinatorial ..:

Yin, Xunzhao ; Qian, Yu ; Vardar, Alptekin...
Nature Communications. 15 (2024) 1 - p. , 2024

Link: https://doi.org/10.1038/..

6

On the Challenges and Design Mitigations of Single Transist..:

Xu, Haotian ; Yang, Jianyi ; Kämpfe, Thomas...
IEEE Electron Device Letters. 45 (2024) 1 - p. 112-115 , 2024

Link: https://doi.org/10.1109/..

7

Enhanced reliability and trapping behavior in ferroelectric..:

, In: 2024 IEEE International Memory Workshop (IMW),

Lederer, Maximilian ; Muller, Franz ; Hoffmann, Raik... - p. 1-4 , 2024

Link: https://doi.org/10.1109/..

8

Ferroelectric Field Effect Transistors–Based Content‐Addres..:

Sunil, Athira ; Rana SK, Masud ; Lederer, Maximilian...
Advanced Intelligent Systems. 6 (2024) 4 - p. , 2024

Link: https://doi.org/10.1002/..

9

Integration of ferroelectric devices for advanced in-memory..:

Seidel, Konrad ; Lehninger, David ; Sünbül, Ayse...
Japanese Journal of Applied Physics. 63 (2024) 5 - p. 050802 , 2024

Link: https://doi.org/10.35848..

10

Improved Endurance Reliability of Ferroelectric Hafnium Oxi..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Sunbul, Ayse ; Lehninger, David ; Hoffmann, Raik... - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

11

In-Situ Encrypted NAND FeFET Array for Secure Storage and C..:

, In: 2023 International Electron Devices Meeting (IEDM),

Zhao, Zijian ; Xu, Yixin ; Read, James... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

12

Impact of High-K Deposition Process on the Noise Immunity o..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Raffel, Yannick ; Olivo, Ricardo ; Lederer, Maximilian... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

13

Hafnium oxide-based Ferroelectric Memories: Are we ready fo..:

, In: 2023 IEEE International Memory Workshop (IMW),

Seidel, Konrad ; Lehninger, David ; Muller, Franz... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

14

Embedding security into ferroelectric FET array via in situ..:

Xu, Yixin ; Xiao, Yi ; Zhao, Zijian...
Nature Communications. 14 (2023) 1 - p. , 2023

Link: https://doi.org/10.1038/..

15

Overcoming Challenges in Integrating Legacy Devices with As..:

, In: 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA),

Zielstorff, Aaron ; Schottke, Dirk ; Hohenhovel, Antonius... - p. 1-8 , 2023

Link: https://doi.org/10.1109/..