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KER, Ming-Dou
209  results:
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1

Test Structures of Cross-Domain Interface Circuits with Dee..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Huang, Huai-Min ; Ker, Ming-Dou - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Latchup Risk in a 4H-SiC Process:

Ke, Chao-Yang ; Ker, Ming-Dou
IEEE Transactions on Electron Devices.  71 (2024)  5 - p. 3424-3428 , 2024
Link: https://doi.org/10.1109/..
 
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3

Investigation of Latch-Up Immunity in 0.18-f.1M BCD Process..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Ho, Wen-Yung ; Ker, Ming-Dou ; Wang, Chun-Chi.. - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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4

A Versatile 8-Channel High Voltage Stimulator for Comprehen..:

, In: 2024 IEEE International Symposium on Circuits and Systems (ISCAS),
Lin, Kuan-Ting ; Ker, Ming-Dou - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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5

Cost-Efficient Solution to Overcome Latch-Up Path in 5 V-To..:

Hsu, Chen-Wei ; Ker, Ming-Dou
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 2224-2227 , 2024
Link: https://doi.org/10.1109/..
 
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6

Test Structures to Investigate ESD Robustness of Integrated..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Wang, Wei-Cheng ; Ker, Ming-Dou - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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7

Investigation of safe operating area and behavior of unclam..:

Ke, Chao-Yang ; Ker, Ming-Dou
Microelectronics Reliability.  155 (2024)  - p. 115347 , 2024
Link: https://doi.org/10.1016/..
 
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8

Design of CMOS Analog Front-End Local-Field Potential Chopp..:

Wu, Chung-Yu ; Huang, Chi-Wei ; Chen, Yu-Wei...
IEEE Transactions on Biomedical Circuits and Systems.  18 (2024)  3 - p. 539-551 , 2024
Link: https://doi.org/10.1109/..
 
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9

Latch-up Risk in 5V-tolerant I/O Buffer Surrounded by NBL I..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Hsu, Chen-Wei ; Ker, Ming-Dou - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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10

Embedded Deep-Nwell Collector Used to Improve Latch-Up Immu..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Hsu, Chen-Wei ; Ker, Ming-Dou ; Chung, Ping-Lin.. - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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11

On-Chip Surge Protection Structure with High Surge Robustne..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Ho, Wen-Yung ; Ker, Ming-Dou - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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12

Verification of the beta oscillations in the subthalamic nu..:

Lin, Hsiao-Chun ; Wu, Yi-Hui ; Huang, Chi-Wei.
Brain Research.  1798 (2023)  - p. 148165 , 2023
Link: https://doi.org/10.1016/..
 
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13

Investigation of CDM ESD Protection Capability Among Power-..:

Huang, Yi-Chun ; Ker, Ming-Dou
IEEE Journal of the Electron Devices Society.  11 (2023)  - p. 84-94 , 2023
Link: https://doi.org/10.1109/..
 
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14

Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFE..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Ke, Chao-Yang ; Tsui, Yu-Chia ; Tsui, Bing-Yue. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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15

Investigation on ESD Robustness of 1200-V D- Mode GaN MIS-H..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Ke, Chao-Yang ; Wang, Wei-Cheng ; Ker, Ming-Dou.. - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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