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2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) ,
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Genetic Algorithm Based Efficient Grouping Technique for Po..:
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2020 IEEE 29th Asian Test Symposium (ATS) ,
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Heuristic Approach for Identification of Random TSV Defects..:
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Communications in Computer and Information Science; VLSI Design and Test ,
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