Kamioka, Takefumi
26  results:
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1

Feature extraction and spatial imaging of synchrotron radia..:

Kutsukake, Kentaro ; Kamioka, Takefumi ; Matsui, Kota...
Science and Technology of Advanced Materials: Methods.  4 (2024)  1 - p. , 2024
 
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4

Simulation study on lateral minority carrier transport in t..:

Kamioka, Takefumi ; Hayashi, Yutaka ; Gotoh, Kazuhiro...
Japanese Journal of Applied Physics.  60 (2021)  2 - p. 026503 , 2021
 
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5

Evaluation of correlation between fill factor and high mobi..:

Nishihara, Tappei ; Kanai, Hiroki ; Ohshita, Yoshio...
Materials Science in Semiconductor Processing.  132 (2021)  - p. 105887 , 2021
 
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6

Evaluation of Sawing Damage for Thin Flexible Silicon Solar..:

, In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
Hara, Yutaka ; Onishi, Kohei ; Yokogawa, Ryo... - p. 0875-0880 , 2020
 
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8

Evaluation of plasma induced defects on silicon substrate b..:

Onishi, Kohei ; Hara, Yutaka ; Nishihara, Tappei...
Japanese Journal of Applied Physics.  59 (2020)  7 - p. 071003 , 2020
 
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9

Surface inversion layer effective minority carrier mobility..:

Kamioka, Takefumi ; Hayashi, Yutaka ; Gotoh, Kazuhiro...
Japanese Journal of Applied Physics.  59 (2020)  SG - p. SGGF06 , 2020
 
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11

Ultra-Thin Lightweight Bendable Crystalline Si Solar Cells ..:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),
Ohshita, Yoshio ; Miyashita, Yukio ; Ogura, Atsushi... - p. 1131-1134 , 2019
 
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12

Evaluation of ITO/a-Si Interface Fabricated by RPD Techniqu:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),
Nishihara, Tappei ; Kamioka, Takefumi ; Kanai, Hiroki... - p. 2702-2704 , 2019
 
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13

Effects of annealing temperature on workfunction of MoO xat..:

Kamioka, Takefumi ; Hayashi, Yutaka ; Isogai, Yuki..
Japanese Journal of Applied Physics.  57 (2018)  7 - p. 076501 , 2018
 
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14

Electrical properties of GaAs//indium tin oxide/Si junction..:

Hara, Tomoya ; Ogawa, Tomoki ; Liang, Jianbo...
Japanese Journal of Applied Physics.  57 (2018)  8S3 - p. 08RD05 , 2018
 
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15

Electrical conduction of Si/indium tin oxide/Si junctions f..:

Liang, Jianbo ; Ogawa, Tomoki ; Hara, Tomoya...
Japanese Journal of Applied Physics.  57 (2018)  2S1 - p. 02BE03 , 2018
 
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