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Kammeugne, Romeo Kom
16
results:
Search for persons
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Format
Online (16)
Mediatypes
Articles (Online) (4)
Bookchapter (Online) (1)
OpenAccess-fulltext (11)
Languages
english (10)
french (4)
Sorted by: Relevance
Sorted by: Year
?
1
On-Wafer Drain Current Variability in GaN MIS-HEMT on 200-m..:
Kammeugne, Romeo Kom
;
Leroux, Charles
;
Theodorou, Christoforos
...
Journal of Electronics and Electrical Engineering. , 2023
Link:
https://doi.org/10.37256..
?
2
In Depth Parasitic Capacitance Analysis on GaN-HEMTs with R..:
Kammeugne, Romeo Kom
;
Leroux, Charles
;
Frutuoso, Tadeu Mota
...
Journal of Electronics and Electrical Engineering. , 2022
Link:
https://doi.org/10.37256..
?
3
On-wafer drain current aariability in GaN MIS-HEMT on 200-m..:
Kammeugne, Romeo Kom
;
Leroux, Charles
;
Theodorou, Christoforos
...
info:eu-repo/semantics/altIdentifier/doi/10.37256/jeee.2120232132. , 2023
Link:
https://hal.science/hal-..
?
4
On-wafer drain current aariability in GaN MIS-HEMT on 200-m..:
Kammeugne, Romeo Kom
;
Leroux, Charles
;
Theodorou, Christoforos
...
info:eu-repo/semantics/altIdentifier/doi/10.37256/jeee.2120232132. , 2023
Link:
https://hal.science/hal-..
?
5
On-wafer drain current aariability in GaN MIS-HEMT on 200-m..:
Kammeugne, Romeo Kom
;
Leroux, Charles
;
Theodorou, Christoforos
...
info:eu-repo/semantics/altIdentifier/doi/10.37256/jeee.2120232132. , 2023
Link:
https://hal.science/hal-..
?
6
On-wafer drain current aariability in GaN MIS-HEMT on 200-m..:
Kammeugne, Romeo Kom
;
Leroux, Charles
;
Theodorou, Christoforos
...
info:eu-repo/semantics/altIdentifier/doi/10.37256/jeee.2120232132. , 2023
Link:
https://hal.science/hal-..
?
7
Thorough electrical characterization of the mechanisms cont..:
Kom Kammeugne, Roméo
NNT: 2022GRALT039. , 2022
Link:
https://theses.hal.scien..
?
8
Thorough electrical characterization of the mechanisms cont..:
Kom Kammeugne, Roméo
NNT: 2022GRALT039. , 2022
Link:
https://theses.hal.scien..
?
9
Ultra-fast CV methods (< 10µs) for interface trap spectrosc..:
Mota Frutuoso, Tadeu
;
Garros, Xavier
;
Lugo-Alvarez, José
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48227.2022.9764550. , 2022
Link:
https://hal.science/hal-..
?
10
Ultra-fast CV methods (< 10µs) for interface trap spectrosc..:
Mota Frutuoso, Tadeu
;
Garros, Xavier
;
Lugo-Alvarez, José
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48227.2022.9764550. , 2022
Link:
https://hal.science/hal-..
?
11
Thorough electrical characterization of the mechanisms cont..:
Kom Kammeugne, Roméo
NNT: 2022GRALT039. , 2022
Link:
https://theses.hal.scien..
?
12
Ultra-fast CV methods (< 10µs) for interface trap spectrosc..:
Mota Frutuoso, Tadeu
;
Garros, Xavier
;
Lugo-Alvarez, José
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS48227.2022.9764550. , 2022
Link:
https://hal.science/hal-..
?
13
Caractérisation électrique approfondie des mécanismes contr..:
Kom kammeugne, Roméo
http://www.theses.fr/2022GRALT039/document. , 2022
Link:
http://www.theses.fr/202..
?
14
Thorough Investigation of Low Frequency Noise Mechanisms in..:
, In:
2021 IEEE International Electron Devices Meeting (IEDM)
,
Kammeugne, R. Kom
;
Theodorou, C.
;
Leroux, C.
... - p. 39.4.1-39.4.4 , 2021
Link:
https://doi.org/10.1109/..
?
15
New insights into low frequency noise (LFN) sources analysi..:
Kom Kammeugne, R.
;
Theodorou, C.
;
Leroux, C.
...
Solid-State Electronics. 200 (2023) - p. 108555 , 2023
Link:
https://doi.org/10.1016/..
1-15