Kampfe, T.
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2

Torwards Variability Immune Scalable FeFET-based Macros for..:

, In: 2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Laleni, N. ; Soliman, T. ; De La Parra, C.... - p. 1-4 , 2023
 
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A Compact 120 GHz LNA in 22 nm FD-SOI with Back-Gate Contro..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
Rack, M. ; Nyssens, L. ; Le, Q. H.... - p. 386-389 , 2023
 
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6

Endurance Study of Silicon-Doped Hafnium Oxide (HSO) and Zi..:

Duhan, P. ; Ali, T. ; Khedgarkar, P....
IEEE Transactions on Electron Devices.  70 (2023)  11 - p. 5645-5650 , 2023
 
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8

Impact of Stack Structure Control and Ferroelectric Materia..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Ali, T. ; Mertens, K. ; Olivo, R.... - p. 1-2 , 2022
 
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9

Three Level Charge Pumping On Dielectric Hafnium Oxide Gate:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Raffel, Y. ; Drescher, M. ; Olivo, R.... - p. 1-4 , 2022
 
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11

Microstructuring technology for large and cylindrical recei..:

Hochedel, M. ; Bichotte, M. ; Arnould, F....
Microelectronic Engineering.  248 (2021)  - p. 111616 , 2021
 
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13

Heavy Ion Irradiation Effects on Structural and Ferroelectr..:

, In: 2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF),
Kampfe, T. ; Vogel, T. ; Olivo, R.... - p. 1-3 , 2020
 
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15

Impact of Ferroelectric Wakeup on Reliability of Laminate b..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ali, T. ; Kuhnel, K. ; Czernohorsky, M.... - p. 1-9 , 2020
 
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