Kang, Hee-Bok
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2

Effects of Bulk Microdefects and Metallic Impurities on p–n..:

Kim, Kwang-Salk ; Moon, Byeong-sam ; Kang, Hee-Bok..
Japanese Journal of Applied Physics.  49 (2010)  3R - p. 031301 , 2010
 
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3

BIDIRECTIONAL FLOATING-BASE BJT ESD PROTECTED RFID CHIP:

KANG, HEE-BOK ; LEE, MISEOK ; KI, JEONG-OK...
Integrated Ferroelectrics.  112 (2010)  1 - p. 42-52 , 2010
 
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4

FLOATING-BASE BJT TYPE ESD DEVICE FOR RFID CHIP:

CHUNG, JINYONG ; KANG, HEE-BOK ; HONG, SUK-KYOUNG...
Integrated Ferroelectrics.  105 (2009)  1 - p. 45-52 , 2009
 
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11

Heteroepitaxal fabrication and structural characterizations..:

An, Sung Jin ; Park, Won Il ; Yi, Gyu-Chul...
Applied Physics Letters.  84 (2004)  18 - p. 3612-3614 , 2004
 
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15

Issues and Reliability of High-Density FeRAMs:

Noh, Keum Hwan ; Yang, Beelyong ; Lee, Seok Won...
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 4B - p. 2096-2099 , 2003
 
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