Kang, Shin-haeng
810  results:
Search for persons X
?
2

The Era of Generative Artificial Intelligence: In-Memory Co..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
?
3

Samsung PIM/PNM for Transfmer Based AI : Energy Efficiency ..:

, In: 2023 IEEE Hot Chips 35 Symposium (HCS),
Kim, Jin Hyun ; Ro, Yuhwan ; So, Jinin... - p. 1-31 , 2023
 
?
6

An Architecture of Sparse Length Sum Accelerator in AxDIMM:

, In: 2022 IEEE 4th International Conference on Artificial Intelligence Circuits and Systems (AICAS),
 
?
7

Hardware architecture and software stack for PIM based on c..:

, In: Proceedings of the 48th Annual International Symposium on Computer Architecture,
Lee, Sukhan ; Kang, Shin-haeng ; Lee, Jaehoon... - p. 43-56 , 2021
 
?
8

Hardware Architecture and Software Stack for PIM Based on C..:

, In: 2021 ACM/IEEE 48th Annual International Symposium on Computer Architecture (ISCA),
Lee, Sukhan ; Kang, Shin-haeng ; Lee, Jaehoon... - p. 43-56 , 2021
 
?
9

Fast parallel simulation of a manycore architecture with a ..:

, In: Proceedings of the 18th International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation,
Kang, Shin-haeng ; Kang, Jintaek ; Ha, Soonhoi - p. 115-122 , 2018
 
?
10

Real-time co-scheduling of multiple dataflow graphs on mult..:

, In: Proceedings of the 53rd Annual Design Automation Conference,
 
?
 
?
12

Reliability-aware mapping optimization of multi-core system..:

, In: Proceedings of the conference on Design, Automation & Test in Europe,
 
?
13

Dynamic Behavior Specification and Dynamic Mapping for Real..:

Jung, Hanwoong ; Lee, Chanhee ; Kang, Shin-Haeng...
ACM Transactions on Embedded Computing Systems.  13 (2014)  4s - p. 1-26 , 2014
 
?
14

Dynamic Behavior Specification and Dynamic Mapping for Real..:

Jung, Hanwoong ; Lee, Chanhee ; Kang, Shin-Haeng...
ACM Transactions on Embedded Computing Systems (TECS).  13 (2014)  4s - p. 1-26 , 2014
 
?
15

Reliability-aware mapping optimization of multi-core system..:

, In: 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE),
 
1-15