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Kao, Kuo-Hsing
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1

Impact of Dual-Gate Configuration on the Endurance of Ferro..:

Ma, William Cheng-Yu ; Su, Chun-Jung ; Kao, Kuo-Hsing...
ECS Journal of Solid State Science and Technology.  13 (2024)  4 - p. 045003 , 2024
Link: https://doi.org/10.1149/..
 
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2

Insight into Latchup Risk in 28nm Planar Bulk Technology fo..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Serbulova, Kateryna ; Qiu, Zi-En ; Chen, Shih-Hung... - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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3

Exploring Performance and Reliability Behavior of Nanosheet..:

Ma, William Cheng-Yu ; Su, Chun-Jung ; Kao, Kuo-Hsing...
ECS Journal of Solid State Science and Technology.  12 (2023)  10 - p. 105004 , 2023
Link: https://doi.org/10.1149/..
 
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4

Ferroelectric Tunnel Thin-Film Transistor for Synaptic Appl..:

Ma, William Cheng-Yu ; Su, Chun-Jung ; Kao, Kuo-Hsing...
ECS Journal of Solid State Science and Technology.  12 (2023)  5 - p. 055006 , 2023
Link: https://doi.org/10.1149/..
 
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5

Impact of Nanosheet Thickness on Performance and Reliabilit..:

Ma, William Cheng-Yu ; Su, Chun-Jung ; Kao, Kuo-Hsing...
IEEE Transactions on Nanotechnology.  22 (2023)  - p. 740-746 , 2023
Link: https://doi.org/10.1109/..
 
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6

Impacts of pulse conditions on endurance behavior of ferroe..:

Ma, William Cheng-Yu ; Su, Chun-Jung ; Kao, Kuo-Hsing...
Semiconductor Science and Technology.  38 (2023)  3 - p. 035020 , 2023
Link: https://doi.org/10.1088/..
 
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7

Device simulations with A U-Net model predicting physical q..:

Lee, Wen-Jay ; Hsieh, Wu-Tsung ; Fang, Bin-Horn..
Scientific Reports.  13 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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8

Impacts of material parameters on breakdown voltage and loc..:

Kumar, Kunal ; Lo, Chun-Hsiang ; Chang, Chun-Chun...
Journal of Computational Electronics.  21 (2022)  5 - p. 1163-1165 , 2022
Link: https://doi.org/10.1007/..
 
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9

First Demonstration of Heterogeneous IGZO/Si CFET Monolithi..:

Chang, Shu-Wei ; Lu, Tsung-Han ; Yang, Cong-Yi...
IEEE Transactions on Electron Devices.  69 (2022)  4 - p. 2101-2107 , 2022
Link: https://doi.org/10.1109/..
 
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10

Demonstration of synaptic characteristics of polycrystallin..:

Ma, William Cheng-Yu ; Su, Chun-Jung ; Lee, Yao-Jen...
Semiconductor Science and Technology.  37 (2022)  4 - p. 045003 , 2022
Link: https://doi.org/10.1088/..
 
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11

First Demonstration of Ferroelectric Tunnel Thin-Film Trans..:

Ma, William Cheng-Yu ; Su, Chun-Jung ; Kao, Kuo-Hsing...
IEEE Transactions on Electron Devices.  69 (2022)  11 - p. 6072-6077 , 2022
Link: https://doi.org/10.1109/..
 
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12

Investigation of the passivation-induced VTH shift in p-GaN..:

Tang, Shun-Wei ; Huang, Zhen-Hong ; Chen, Yi-Cheng...
Microelectronics Reliability.  122 (2021)  - p. 114150 , 2021
Link: https://doi.org/10.1016/..
 
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13

Process and Structure Considerations for the Post FinFET Er:

, In: 2020 IEEE Silicon Nanoelectronics Workshop (SNW),
Su, Chun-Jung ; Sung, Po-Jung ; Kao, Kuo-Hsing... - p. 13-14 , 2020
Link: https://doi.org/10.1109/..
 
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14

Silicon Nitride-induced Threshold Voltage Shift in p-GaN HE..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Chen, Yi-Cheng ; Tang, Shun-Wei ; Lin, Pin-Hau... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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15

Impact of the polarization on time-dependent dielectric bre..:

Yang, Ting-Hsin ; Su, Chun-Jung ; Wang, Yu-Shun...
Japanese Journal of Applied Physics.  59 (2020)  SG - p. SGGB08 , 2020
Link: https://doi.org/10.35848..
 
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