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Karim, Nissar
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1

On the effects of 30.5 GHz sinusoidal wave exposure on glio..:

Rampazzo, Elena ; Persano, Luca ; Karim, Nissar...
Frontiers in Oncology.  14 (2024)  - p. , 2024
Link: https://doi.org/10.3389/..
 
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2

Characterization of Glioblastoma Organoid Bio-Responses Upo..:

, In: 2023 IEEE MTT-S International Microwave Biomedical Conference (IMBioC),
Rampazzo, Elena ; Karim, Nissar ; Persano, Luca... - p. 73-75 , 2023
Link: https://doi.org/10.1109/..
 
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3

Mitigation of Threshold Voltage Shift Due to Negative Bias ..:

Karim, Nissar Mohammad ; Soin, Norhayati ; Fearday, Christopher
National Academy Science Letters.  43 (2019)  1 - p. 23-26 , 2019
Link: https://doi.org/10.1007/..
 
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4

Development of an inductor incorporated onto a carbon fiber..:

Fearday, Christopher ; Ward, Thomas Arthur ; Soin, Norhayati..
Microsystem Technologies.  23 (2016)  5 - p. 1433-1442 , 2016
Link: https://doi.org/10.1007/..
 
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5

Pareto ANOVA analysis for CMOS 0.18µm two-stage Op-amp:

Chachuli, Siti Amaniah Mohd ; Fasyar, Puteri Nor Aznie ; Soin, Norhayati..
Materials Science in Semiconductor Processing.  24 (2014)  - p. 9-14 , 2014
Link: https://doi.org/10.1016/..
 
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6

Exploitation of renewable energy for sustainable developmen..:

Ahmed, Shamsuddin ; Islam, Md Tasbirul ; Karim, Mohd Aminul.
Renewable Energy.  72 (2014)  - p. 223-235 , 2014
Link: https://doi.org/10.1016/..
 
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7

Unification of contemporary negative bias temperature insta..:

Karim, Nissar Mohammad ; Manzoor, Sadia ; Soin, Norhayati
Renewable and Sustainable Energy Reviews.  26 (2013)  - p. 776-780 , 2013
Link: https://doi.org/10.1016/..
 
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8

Prediction of energy change due to hot carrier injection in..:

Karim, Nissar Mohammad ; Soin, Norhayati ; Manzoor, Sadia..
Microelectronic Engineering.  111 (2013)  - p. 256-260 , 2013
Link: https://doi.org/10.1016/..
 
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9

RD50-MPW3: A fully monolithic digital CMOS sensor for futur..:

Sieberer, Patrick ; Zhang, Chenfan ; Bergauer, Thomas...
http://arxiv.org/abs/2211.11244.  , 2022
Link: http://arxiv.org/abs/221..
 
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10

Edge-TCT evaluation of high voltage-CMOS test structures wi..:

Wade, Ben ; Franks, Matthew ; Hammerich, Jan...
info:eu-repo/semantics/altIdentifier/doi/10.1088/1748-0221/17/12/C12017.  , 2022
Link: https://hdl.handle.net/2..
 
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