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Kastensmidt, F. L.
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1

Assessing the Impacts of Radiation-induced Soft Errors on A..:

Benevenuti, F. ; Gobatto, L. ; Bastos, R. Possamai..
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Effects of thermal neutron radiation on a hardware-implemen..:

Garay Trindade, M. ; Benevenuti, F. ; Letiche, M....
Microelectronics Reliability.  116 (2021)  - p. 114022 , 2021
Link: https://doi.org/10.1016/..
 
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3

Circuit design using Schmitt Trigger to reliability improve..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability.  114 (2020)  - p. 113754 , 2020
Link: https://doi.org/10.1016/..
 
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4

Mitigation of process variability effects using decoupling ..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability.  100-101 (2019)  - p. 113446 , 2019
Link: https://doi.org/10.1016/..
 
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5

Building ATMR circuits using approximate library and heuris..:

Albandes, I. ; Martins, M. ; Cuenca-Asensi, S..
Microelectronics Reliability.  97 (2019)  - p. 24-30 , 2019
Link: https://doi.org/10.1016/..
 
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6

Approximate TMR based on successive approximation and loop ..:

Rodrigues, G.S. ; Fonseca, J.S. ; Kastensmidt, F.L....
Microelectronics Reliability.  100-101 (2019)  - p. 113385 , 2019
Link: https://doi.org/10.1016/..
 
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7

Dynamic heavy ions SEE testing of NanoXplore radiation hard..:

Oliveira, A. ; Benevenuti, F. ; Benites, L....
Microelectronics Reliability.  100-101 (2019)  - p. 113437 , 2019
Link: https://doi.org/10.1016/..
 
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8

Impact of different transistor arrangements on gate variabi..:

Zimpeck, A.L. ; Meinhardt, C. ; Artola, L....
Microelectronics Reliability.  88-90 (2018)  - p. 111-115 , 2018
Link: https://doi.org/10.1016/..
 
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9

Design of approximate-TMR using approximate library and heu..:

Albandes, I. ; Serrano-Cases, A. ; Martins, M....
Microelectronics Reliability.  88-90 (2018)  - p. 898-902 , 2018
Link: https://doi.org/10.1016/..
 
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10

Evaluation of radiation-induced soft error in majority vote..:

de Aguiar, Y.Q. ; Artola, L. ; Hubert, G....
Microelectronics Reliability.  76-77 (2017)  - p. 660-664 , 2017
Link: https://doi.org/10.1016/..
 
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11

Analyzing the impact of radiation-induced failures in flash..:

Tambara, L.A. ; Chielle, E. ; Kastensmidt, F.L....
Microelectronics Reliability.  76-77 (2017)  - p. 640-643 , 2017
Link: https://doi.org/10.1016/..
 
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12

Impact of dynamic voltage scaling and thermal factors on SR..:

Rosa, F.R. ; Brum, R.M. ; Wirth, G....
Microelectronics Reliability.  55 (2015)  9-10 - p. 1486-1490 , 2015
Link: https://doi.org/10.1016/..
 
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13

Voltage scaling and aging effects on soft error rate in SRA..:

Kastensmidt, F.L. ; Tonfat, J. ; Both, T....
Microelectronics Reliability.  54 (2014)  9-10 - p. 2344-2348 , 2014
Link: https://doi.org/10.1016/..
 
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14

Asynchronous circuits as alternative for mitigation of long..:

Bastos, R.P. ; Sicard, G. ; Kastensmidt, F...
Microelectronics Reliability.  50 (2010)  9-11 - p. 1241-1246 , 2010
Link: https://doi.org/10.1016/..
 
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15

Using built-in sensors to cope with long duration transient..:

, In: 2007 IEEE International Test Conference,
Lisboa, C. A. ; Kastensmidt, F. L. ; Henes Neto, E... - p. None , 2007
Link: https://doi.org/10.1109/..
 
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