E-LIB Suche - Ergebnisse für: Kavousianos, Xrysovalantis

1

Multi-site test optimization for multi-Vdd SoCs using space..:

, In: 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE),

Vartziotis, Fotis ; Kavousianos, Xrysovalantis ; Chakrabarty, Krishnendu.. - p. 1-6 , 2014

Link: https://doi.org/10.7873/..

2

Multi-site test optimization for multi-Vdd SoCs using space..:

, In: Proceedings of the conference on Design, Automation & Test in Europe,

Vartziotis, Fotis ; Kavousianos, Xrysovalantis ; Chakrabarty, Krishnendu.. - p. 1-6 , 2014

Link: https://dl.acm.org/doi/1..

3

Static Power Reduction Using Variation-Tolerant and Reconfi..:

Zhang, Zhaobo ; Kavousianos, Xrysovalantis ; Chakrabarty, Krishnendu.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22 (2014) 1 - p. 13-26 , 2014

Link: https://doi.org/10.1109/..

4

Testing for SoCs with advanced static and dynamic power-man..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,

Kavousianos, Xrysovalantis ; Chakrabarty, Krishnendu - p. 737-742 , 2013

Link: https://dl.acm.org/doi/1..

5

Test-data volume and scan-power reduction with low ATE inte..:

, In: Proceedings of the International Conference on Computer-Aided Design,

Tenentes, Vasileios ; Kavousianos, Xrysovalantis - p. 747-754 , 2011

Link: https://dl.acm.org/doi/1..

6

Defect-Oriented LFSR Reseeding to Target Unmodeled Defects ..:

Kavousianos, Xrysovalantis ; Tenentes, Vasileios ; Chakrabarty, Krishnendu.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19 (2011) 12 - p. 2330-2335 , 2011

Link: https://doi.org/10.1109/..

7

Generation of compact test sets with high defect coverage:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,

Kavousianos, Xrysovalantis ; Chakrabarty, Krishnendu - p. 1130-1135 , 2009

Link: https://dl.acm.org/doi/1..

8

Efficient partial scan cell gating for low-power scan-based..:

Kavousianos, Xrysovalantis ; Bakalis, Dimitris ; Nikolos, Dimitris
ACM Transactions on Design Automation of Electronic Systems (TODAES). 14 (2009) 2 - p. 1-15 , 2009

Link: https://dl.acm.org/doi/1..

9

Efficient partial scan cell gating for low-power scan-based..:

Kavousianos, Xrysovalantis ; Bakalis, Dimitris ; Nikolos, Dimitris
ACM Transactions on Design Automation of Electronic Systems. 14 (2009) 2 - p. 1-15 , 2009

Link: https://doi.org/10.1145/..

10

Multilevel-Huffman Test-Data Compression for IP Cores With ..:

Kavousianos, Xrysovalantis ; Kalligeros, Emmanouil ; Nikolos, Dimitris
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 16 (2008) 7 - p. 926-931 , 2008

Link: https://doi.org/10.1109/..

11

Fault-Independent Test-Generation for Software-Based Self-T..:

Georgiou, Panagiotis ; Kavousianos, Xrysovalantis ; Cantoro, Riccardo.
info:eu-repo/semantics/altIdentifier/wos/WOS:000471007800014. , 2019

Link: https://hdl.handle.net/1..

12

Timing Error Detection and Correction by Time Dilation:

Floros, Andreas ; Tsiatouhas, Yiorgos ; Kavousianos, Xrysovalantis
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-642-12267-5_15. , 2008

Link: https://hal.inria.fr/hal..

13

Timing Error Detection and Correction by Time Dilation:

Floros, Andreas ; Tsiatouhas, Yiorgos ; Kavousianos, Xrysovalantis
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-642-12267-5_15. , 2008

Link: https://hal.inria.fr/hal..