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Kawamura, Tomoaki
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1

Identification and mechanistic investigation of ellagitanni..:

Bogahawaththa, Sudarma ; Kawamura, Tomoaki ; Bandaranayake, Udari...
Bioscience, Biotechnology, and Biochemistry.  87 (2023)  11 - p. 1295-1309 , 2023
Link: https://doi.org/10.1093/..
 
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2

Artificial Intelligence Failure Diagnosis when Inspecting P..:

, In: 2022 9th International Conference on Condition Monitoring and Diagnosis (CMD),
Kawamura, Tomoaki ; Ishikawa, Kentaro ; Saito, Toshiyuki. - p. 832-835 , 2022
Link: https://doi.org/10.23919..
 
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3

Synchrotron radiation microbeam X-ray diffraction for nonde..:

Sakaki, Atsushi ; Funato, Mitsuru ; Kawamura, Tomoaki..
Applied Physics Express.  11 (2018)  3 - p. 031001 , 2018
Link: https://doi.org/10.7567/..
 
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4

A novel DBA scheme for TDM-PON based mobile fronthaul:

, In: OFC 2014,
Tashiro, Takayoshi ; Kuwano, Shigeru ; Terada, Jun... - p. 1-3 , 2014
Link: https://doi.org/10.1364/..
 
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5

Depth-selective structural analysis of thin films using tot..:

Kawamura, Tomoaki ; Omi, Hiroo
Journal of Physics: Condensed Matter.  22 (2010)  47 - p. 474009 , 2010
Link: https://doi.org/10.1088/..
 
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6

Stability-instability transition of reaction fronts in ther..:

Omi, Hiroo ; Kageshima, Hiroyuki ; Kawamura, Tomoaki...
Physical Review B.  79 (2009)  24 - p. , 2009
Link: https://doi.org/10.1103/..
 
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7

Real-Time Analyses of Strain in Ultrathin Silicon Nanolayer..:

Omi, Hiroo ; Kawamura, Tomoaki ; Kobayashi, Yoshihiro...
Applied Physics Express.  2 (2009)  12 - p. 126503 , 2009
Link: https://doi.org/10.1143/..
 
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8

In-plane strain distribution in the surface region of thin ..:

Omi, Hiroo ; Kawamura, Tomoaki ; Fujikawa, Seiji...
Applied Physics Letters.  86 (2005)  26 - p. , 2005
Link: https://doi.org/10.1063/..
 
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9

Real-Time Observation of Fractional-Order X-ray Reflection ..:

Fujikawa, Seiji ; Kawamura, Tomoaki ; Bhunia, Satyaban...
Japanese Journal of Applied Physics.  44 (2005)  1L - p. L144 , 2005
Link: https://doi.org/10.1143/..
 
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10

High-performance EUV/soft X-ray ellipsometry system using m..:

Kawamura, Tomoaki ; Delaunay, Jean-Jacques ; Takenaka,, Hisataka..
Journal of Synchrotron Radiation.  5 (1998)  3 - p. 735-737 , 1998
Link: https://doi.org/10.1107/..
 
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11

Design and fabrication of highly heat-resistant Mo/Si multi..:

Takenaka, Hisataka ; Ito, Hisashi ; Haga, Tsuneyuki.
Journal of Synchrotron Radiation.  5 (1998)  3 - p. 708-710 , 1998
Link: https://doi.org/10.1107/..
 
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12

Initial domain structure of GaAs thin films grown on Si(001..:

Kawamura, Tomoaki ; Takenaka, Hisataka ; Hayashi, Takayoshi..
Applied Surface Science.  117-118 (1997)  - p. 765-770 , 1997
Link: https://doi.org/10.1016/..
 
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13

Thermal stability of Mo/C/Si/C multilayer soft X-ray mirror:

Takenaka, Hisataka ; Kawamura, Tomoaki
Journal of Electron Spectroscopy and Related Phenomena.  80 (1996)  - p. 381-384 , 1996
Link: https://doi.org/10.1016/..
 
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14

Initial domain structure of hydride vapor phase epitaxy GaA..:

Kawamura, Tomoaki ; Takenaka, Hisataka ; Hayashi, Takayoshi..
Applied Physics Letters.  68 (1996)  14 - p. 1969-1971 , 1996
Link: https://doi.org/10.1063/..
 
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15

Independent Characterization of Density and Interface Rough..:

Tomoaki Kawamura, Tomoaki Kawamura ; Hisataka Takenaka, Hisataka Takenaka ; Takayoshi Hayashi, Takayoshi Hayashi
Japanese Journal of Applied Physics.  34 (1995)  6R - p. 3290 , 1995
Link: https://doi.org/10.1143/..
 
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