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Kawamura, Tomoaki
200
results:
Search for persons
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Online (200)
Mediatypes
E-Books (3)
Articles (Online) (119)
Bookchapter (Online) (4)
OpenAccess-fulltext (74)
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english (167)
portuguese (1)
Sorted by: Relevance
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?
1
Identification and mechanistic investigation of ellagitanni..:
Bogahawaththa, Sudarma
;
Kawamura, Tomoaki
;
Bandaranayake, Udari
...
Bioscience, Biotechnology, and Biochemistry. 87 (2023) 11 - p. 1295-1309 , 2023
Link:
https://doi.org/10.1093/..
?
2
Artificial Intelligence Failure Diagnosis when Inspecting P..:
, In:
2022 9th International Conference on Condition Monitoring and Diagnosis (CMD)
,
Kawamura, Tomoaki
;
Ishikawa, Kentaro
;
Saito, Toshiyuki
. - p. 832-835 , 2022
Link:
https://doi.org/10.23919..
?
3
Synchrotron radiation microbeam X-ray diffraction for nonde..:
Sakaki, Atsushi
;
Funato, Mitsuru
;
Kawamura, Tomoaki
..
Applied Physics Express. 11 (2018) 3 - p. 031001 , 2018
Link:
https://doi.org/10.7567/..
?
4
A novel DBA scheme for TDM-PON based mobile fronthaul:
, In:
OFC 2014
,
Tashiro, Takayoshi
;
Kuwano, Shigeru
;
Terada, Jun
... - p. 1-3 , 2014
Link:
https://doi.org/10.1364/..
?
5
Depth-selective structural analysis of thin films using tot..:
Kawamura, Tomoaki
;
Omi, Hiroo
Journal of Physics: Condensed Matter. 22 (2010) 47 - p. 474009 , 2010
Link:
https://doi.org/10.1088/..
?
6
Stability-instability transition of reaction fronts in ther..:
Omi, Hiroo
;
Kageshima, Hiroyuki
;
Kawamura, Tomoaki
...
Physical Review B. 79 (2009) 24 - p. , 2009
Link:
https://doi.org/10.1103/..
?
7
Real-Time Analyses of Strain in Ultrathin Silicon Nanolayer..:
Omi, Hiroo
;
Kawamura, Tomoaki
;
Kobayashi, Yoshihiro
...
Applied Physics Express. 2 (2009) 12 - p. 126503 , 2009
Link:
https://doi.org/10.1143/..
?
8
In-plane strain distribution in the surface region of thin ..:
Omi, Hiroo
;
Kawamura, Tomoaki
;
Fujikawa, Seiji
...
Applied Physics Letters. 86 (2005) 26 - p. , 2005
Link:
https://doi.org/10.1063/..
?
9
Real-Time Observation of Fractional-Order X-ray Reflection ..:
Fujikawa, Seiji
;
Kawamura, Tomoaki
;
Bhunia, Satyaban
...
Japanese Journal of Applied Physics. 44 (2005) 1L - p. L144 , 2005
Link:
https://doi.org/10.1143/..
?
10
High-performance EUV/soft X-ray ellipsometry system using m..:
Kawamura, Tomoaki
;
Delaunay, Jean-Jacques
;
Takenaka,, Hisataka
..
Journal of Synchrotron Radiation. 5 (1998) 3 - p. 735-737 , 1998
Link:
https://doi.org/10.1107/..
?
11
Design and fabrication of highly heat-resistant Mo/Si multi..:
Takenaka, Hisataka
;
Ito, Hisashi
;
Haga, Tsuneyuki
.
Journal of Synchrotron Radiation. 5 (1998) 3 - p. 708-710 , 1998
Link:
https://doi.org/10.1107/..
?
12
Initial domain structure of GaAs thin films grown on Si(001..:
Kawamura, Tomoaki
;
Takenaka, Hisataka
;
Hayashi, Takayoshi
..
Applied Surface Science. 117-118 (1997) - p. 765-770 , 1997
Link:
https://doi.org/10.1016/..
?
13
Thermal stability of Mo/C/Si/C multilayer soft X-ray mirror:
Takenaka, Hisataka
;
Kawamura, Tomoaki
Journal of Electron Spectroscopy and Related Phenomena. 80 (1996) - p. 381-384 , 1996
Link:
https://doi.org/10.1016/..
?
14
Initial domain structure of hydride vapor phase epitaxy GaA..:
Kawamura, Tomoaki
;
Takenaka, Hisataka
;
Hayashi, Takayoshi
..
Applied Physics Letters. 68 (1996) 14 - p. 1969-1971 , 1996
Link:
https://doi.org/10.1063/..
?
15
Independent Characterization of Density and Interface Rough..:
Tomoaki Kawamura, Tomoaki Kawamura
;
Hisataka Takenaka, Hisataka Takenaka
;
Takayoshi Hayashi, Takayoshi Hayashi
Japanese Journal of Applied Physics. 34 (1995) 6R - p. 3290 , 1995
Link:
https://doi.org/10.1143/..
1-15