Khandelwal, Sourabh
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2

Machine Learning-Based Large-Signal Parameter Extraction fo..:

Chavez, Fredo ; Khandelwal, Sourabh
IEEE Microwave and Wireless Technology Letters.  34 (2024)  2 - p. 147-150 , 2024
 
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3

A Neural Network-based Manufacturing Variability Modeling o..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
 
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4

Fast, Scalable, and Highly Accurate Thermal Modeling for Us..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Drandova, Gergana ; Jimenez, Jose ; Wisch, Jesse.. - p. 01-04 , 2024
 
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7

I-V Global Parameter Extraction for Industry Standard FinFE..:

, In: 2023 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT),
Chavez, Fredo ; Chen, Jen-Hao ; Tung, Chien-Ting.. - p. 20-22 , 2023
 
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8

Deep Learning-Based ASM-HEMT High Frequency Parameter Extra..:

, In: 2023 IEEE Wireless and Microwave Technology Conference (WAMICON),
Chavez, Fredo ; Khandelwal, Sourabh - p. 41-44 , 2023
 
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10

Accurate Modelling of GaN HEMT Capacitances in the Framewor..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
 
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13

Statistical Modeling of Manufacturing Variability in GaN HE..:

, In: 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022,
 
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14

A Physics-Based Model of Vertical TFET—Part I: Modeling of ..:

Cheng, Qi ; Khandelwal, Sourabh ; Zeng, Yuping
IEEE Transactions on Electron Devices.  69 (2022)  7 - p. 3966-3973 , 2022
 
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15

Deep Learning-Based ASM-HEMT I-V Parameter Extraction:

Chavez, Fredo ; Davis, Devin T. ; Miller, Nicholas C..
IEEE Electron Device Letters.  43 (2022)  10 - p. 1633-1636 , 2022
 
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