Zhang, Yu ; Kong, Charlie ; Davidsen, Rasmus Schmidt... Zhang , Y , Kong , C , Davidsen , R S , Scardera , G , Duan , L , Thong Khoo , K , Payne , D N R , Hoex , B & Abbott , M D 2020 , ' 3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon ' , Ultramicroscopy , vol. 218 , no. 113084 , 113084 . https://doi.org/10.1016/j.ultramic.2020.113084.
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2020