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Kieft, Erik
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1

Ultrafast SEM:

Hlavenka, Petr ; Kieft, Erik ; Vesseur, Ernst Jan
Microscopy and Microanalysis.  25 (2019)  S2 - p. 268-269 , 2019
Link: https://doi.org/10.1017/..
 
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2

Resonant RF Cavity Based Beam Chopping for Precise Control ..:

Kieft, Erik ; van Rens, Jasper ; Verhoeven, Wouter..
Microscopy and Microanalysis.  25 (2019)  S2 - p. 1666-1667 , 2019
Link: https://doi.org/10.1017/..
 
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3

Effects of Electron-Gun and Laser Parameters on Collection ..:

Kieft, Erik ; Schliep, Karl B. ; Suri, Pranav K..
Microscopy and Microanalysis.  21 (2015)  S3 - p. 807-808 , 2015
Link: https://doi.org/10.1017/..
 
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4

Refinement of Monte Carlo simulations of electron–specimen ..:

Kieft, Erik ; Bosch, Eric
Journal of Physics D: Applied Physics.  41 (2008)  21 - p. 215310 , 2008
Link: https://doi.org/10.1088/..
 
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5

Exploring Functional Materials by Understanding Beam‐Sample..:

Kisielowski, Christian ; Specht, Petra ; Rozeveld, Steve...
Advanced Functional Materials.  32 (2022)  27 - p. , 2022
Link: https://doi.org/10.1002/..
 
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6

Discovering Hidden Material Properties of MgCl2at Atomic Re..:

Kisielowski, Christian ; Specht, Petra ; Freitag, Bert...
Advanced Functional Materials.  29 (2019)  11 - p. 1807818 , 2019
Link: https://doi.org/10.1002/..
 
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7

Towards Atomic Resolution Electron Microscopy with Structur..:

Kisielowski, Christian ; Specht, Petra ; Freitag, Bert...
Microscopy and Microanalysis.  25 (2019)  S2 - p. 1652-1653 , 2019
Link: https://doi.org/10.1017/..
 
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8

Communication: Effects of thermionic-gun parameters on oper..:

Kieft, Erik ; Schliep, Karl B ; Suri, Pranav K.
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4711641/.  , 2015
Link: http://www.ncbi.nlm.nih...
 
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9

Time-of-flight electron energy loss spectroscopy using TM11..:

Verhoeven, W ; van Rens, J.F.M ; Van Ninhuijs, M.A.W...
Verhoeven , W , van Rens , J F M , Van Ninhuijs , M A W , Toonen , W F , Kieft , E R , Mutsaers , P H A & Luiten , O J 2016 , ' Time-of-flight electron energy loss spectroscopy using TM110 deflection cavities ' , Structural Dynamics , vol. 3 , no. 054303 , 054303 , pp. 054303-1 - 054303-7 . https://doi.org/10.1063/1.4962698.  , 2016
Link: https://research.tue.nl/..
 
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10

High quality ultrafast transmission electron microscopy usi..:

Verhoeven, W Wouter ; Rens, JFM Jasper van ; Kieft, ER Erik..
ISSN:0304-3991.  , 2018
Link: http://repository.tue.nl..
 
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11

Time-of-flight electron energy loss spectroscopy by longitu..:

Verhoeven, W Wouter ; Rens, JFM Jasper van ; Toonen, WF...
ISSN:2329-7778.  , 2018
Link: http://repository.tue.nl..
 
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12

Time-of-flight electron energy loss spectroscopy using TM11..:

Verhoeven, W Wouter ; Rens, JFM Jasper van ; Ninhuijs, MAW Mark van...
ISSN:2329-7778.  , 2016
Link: http://repository.tue.nl..
 
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13

Ultrafast time-resolved electron microscopy:

Verhoeven, W Wouter ; Rens, JFM Jasper van ; Kieft, ER Erik... , 2015
Link: http://repository.tue.nl..
 
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14

Communication: Effects of thermionic-gun parameters on oper..:

Erik Kieft ; Karl B. Schliep ; Pranav K. Suri.
http://dx.doi.org/10.1063/1.4930174.  , 2015
Link: https://doi.org/10.1063/..
 
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15

High-quality, high-repetition rate, ultrashort electron bun..:

Rens, JFM Jasper van ; Verhoeven, W Wouter ; Kieft, ER Erik... , 2015
Link: http://repository.tue.nl..
 
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