I agree that this site is using cookies. You can find further informations here.
X
Kim, Byungwhan
98  results:
Search for persons X
?
1

In-Line Hologram for Plasma Diagnostics:

Kim, Byungwhan ; Jung, Jin-Su
Journal of the Optical Society of Korea.  20 (2016)  4 - p. 524-529 , 2016
Link: https://doi.org/10.3807/..
 
?
2

Use of Speckle Pattern for Monitoring Thermal Energy Behavi..:

Kim, Byungwhan ; Jang, Junyoung
Journal of the Optical Society of Korea.  20 (2016)  3 - p. 396-400 , 2016
Link: https://doi.org/10.3807/..
 
?
3

Measurement of surface roughness of plasma-deposited films ..:

Kim, Byungwhan ; Seo, Junhyun
Applied Surface Science.  359 (2015)  - p. 204-208 , 2015
Link: https://doi.org/10.1016/..
 
?
4

Plasma sensor for monitoring laser-interacting particles in..:

Kim, Byungwhan ; Jung, Dongwha ; Han, Dongil
Electronic Materials Letters.  10 (2014)  3 - p. 655-659 , 2014
Link: https://doi.org/10.1007/..
 
?
5

Corrigendum to: "Duty ratio impact on SiN films deposited i..:

Kim, Daehyun ; Kim, Byungwhan ; Yoon, Neung-Goo
Microelectronic Engineering.  113 (2014)  - p. 10 , 2014
Link: https://doi.org/10.1016/..
 
?
6

Erratum to: Visible electron orbits of carbon atom:

Kim, Byungwhan
Electronic Materials Letters.  9 (2013)  6 - p. 891-891 , 2013
Link: https://doi.org/10.1007/..
 
?
7

Exponentially weighted moving average-based procedure with ..:

Jeong, Young-Seon ; Kim, Byungwhan ; Ko, Young-Don
Expert Systems with Applications.  40 (2013)  14 - p. 5688-5693 , 2013
Link: https://doi.org/10.1016/..
 
?
8

Regulation of plasma discharge using fuzzy logic and an in-..:

Kim, Byungwhan ; Choi, Seongjin
International Journal of Control, Automation and Systems.  10 (2012)  3 - p. 644-650 , 2012
Link: https://doi.org/10.1007/..
 
?
9

Use of neural network to in situ conditioning of semiconduc..:

Kim, Byungwhan ; Kim, Daehyun
Applied Soft Computing.  12 (2012)  2 - p. 826-831 , 2012
Link: https://doi.org/10.1016/..
 
?
10

Design and VLSI implementation of a high-performance face d..:

Han, Dongil ; Choi, Jongho ; Kim, Byungwhan.
Computers & Electrical Engineering.  38 (2012)  5 - p. 1222-1239 , 2012
Link: https://doi.org/10.1016/..
 
?
11

Analysis of ion energy impact on the refractive index of si..:

Kim, Daehyun ; Kim, Byungwhan
Current Applied Physics.  12 (2012)  1 - p. 40-43 , 2012
Link: https://doi.org/10.1016/..
 
?
12

Visible electron orbits of carbon atom:

Kim, Byungwhan
Electronic Materials Letters.  8 (2012)  6 - p. 627-630 , 2012
Link: https://doi.org/10.1007/..
 
?
13

Visible micron-sized particles in an electropositive gas:

Kim, Byungwhan ; Kim, Daehyun ; Kim, Taegeun
Current Applied Physics.  12 (2012)  - p. S108-S112 , 2012
Link: https://doi.org/10.1016/..
 
?
14

Duty ratio impact on SiN films deposited in SiH4-NH3 plasma..:

Kim, Daehyun ; Kim, Byungwhan ; Yoon, Neung-Goo
Microelectronic Engineering.  89 (2012)  - p. 116-119 , 2012
Link: https://doi.org/10.1016/..
 
?
15

Prediction on the Seasonal Behavior of Hydrogen Sulfide Usi..:

Kim, Byungwhan ; Lee, Joogong ; Jang, Jungyoung..
The Scientific World JOURNAL.  11 (2011)  - p. 992-1004 , 2011
Link: https://doi.org/10.1100/..
 
1-15