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Kim, Chang Ouk
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1

SAFE: Unsupervised image feature extraction using self‐atte..:

Choi, Yeoung Je ; Lee, Gyeong Taek ; Kim, Chang Ouk
Expert Systems.  41 (2024)  8 - p. , 2024
Link: https://doi.org/10.1111/..
 
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2

Collective Decision of One-vs-Rest Networks for Open-Set Re..:

Jang, Jaeyeon ; Kim, Chang Ouk
IEEE Transactions on Neural Networks and Learning Systems.  35 (2024)  2 - p. 2327-2338 , 2024
Link: https://doi.org/10.1109/..
 
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3

Modular Reinforcement Learning for Autonomous UAV Flight Co..:

Choi, Jongkwan ; Kim, Hyeon Min ; Hwang, Ha Jun..
Drones.  7 (2023)  7 - p. 418 , 2023
Link: https://doi.org/10.3390/..
 
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4

Virtual Metrology Modeling for Wafer Edges via Graph Attent..:

Joo, Jaehyeon ; Yang, Keun Woo ; Choi, Yeoung Je..
IEEE Transactions on Semiconductor Manufacturing.  36 (2023)  3 - p. 359-366 , 2023
Link: https://doi.org/10.1109/..
 
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5

Discovery of fault-introducing tool groups with a numerical..:

Lee, Yeonju ; Kim, Youngju ; Lee, Bogyeong.
International Journal of Production Research.  62 (2023)  9 - p. 3305-3319 , 2023
Link: https://doi.org/10.1080/..
 
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6

Teacher–Explorer–Student Learning: A Novel Learning Method ..:

Jang, Jaeyeon ; Kim, Chang Ouk
IEEE Transactions on Neural Networks and Learning Systems.  , 2023
Link: https://doi.org/10.1109/..
 
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7

Stepwise Soft Actor–Critic for UAV Autonomous Flight Contro:

Hwang, Ha Jun ; Jang, Jaeyeon ; Choi, Jongkwan...
Drones.  7 (2023)  9 - p. 549 , 2023
Link: https://doi.org/10.3390/..
 
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8

A test vector selection method based on machine learning fo..:

Lim, Hyeong Gu ; Jang, Jaeyeon ; Ju, Byung Kook..
Expert Systems with Applications.  224 (2023)  - p. 120056 , 2023
Link: https://doi.org/10.1016/..
 
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9

Unsupervised novelty pattern classification of shmoo plots ..:

Shin, Hyun Soo ; Kim, Youngju ; Kim, Chang Ouk.
Expert Systems with Applications.  202 (2022)  - p. 117341 , 2022
Link: https://doi.org/10.1016/..
 
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10

A Modified Lasso Model for Yield Analysis Considering the I..:

Heo, Taewon ; Kim, Youngju ; Kim, Chang Ouk
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  1 - p. 32-39 , 2022
Link: https://doi.org/10.1109/..
 
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11

State-Dependent Parameter Tuning of the Apparent Tardiness ..:

Min, Byungwook ; Kim, Chang Ouk
IEEE Access.  10 (2022)  - p. 20187-20198 , 2022
Link: https://doi.org/10.1109/..
 
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12

Attention Mechanism-Based Root Cause Analysis for Semicondu..:

Lee, Min Yong ; Choi, Yeoung Je ; Lee, Gyeong Taek..
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 282-290 , 2022
Link: https://doi.org/10.1109/..
 
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13

Commonality Analysis for Detecting Failures Caused by Inspe..:

An, Dae Woong ; Kim, Seung ; Kim, Hyun Kyu.
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  4 - p. 596-604 , 2022
Link: https://doi.org/10.1109/..
 
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14

Unstructured borderline self-organizing map: Learning highl..:

Jang, Jaeyeon ; Kim, Chang Ouk
Expert Systems with Applications.  188 (2022)  - p. 116028 , 2022
Link: https://doi.org/10.1016/..
 
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15

A variational autoencoder for a semiconductor fault detecti..:

Kim, Youngju ; Lee, Hoyeop ; Kim, Chang Ouk
Journal of Intelligent Manufacturing.  34 (2021)  2 - p. 529-540 , 2021
Link: https://doi.org/10.1007/..
 
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