E-LIB Suche - Ergebnisse für: Kim, Doo-Hyun

1

Analysis of Risk Priority Number of FMEA and Surprise Index..:

Hwang, Suk Keun ; Kim, Doo-Hyun ; Kim, Sung-Chul
Journal of Loss Prevention in the Process Industries. , 2024

Link: https://doi.org/10.1016/..

2

13.1 A 1Tb 4b/cell NAND Flash Memory with tPROG=2ms, tR=110..:

, In: 2020 IEEE International Solid- State Circuits Conference - (ISSCC),

Kim, Doo-Hyun ; Kim, Hyunggon ; Yun, Sungwon... - p. 218-220 , 2020

Link: https://doi.org/10.1109/..

3

Accelerating Image Classification using Feature Map Similar..:

Park, Keunyoung ; Kim, Doo-Hyun
Applied Sciences. 9 (2018) 1 - p. 108 , 2018

Link: https://doi.org/10.3390/..

4

Change of Precipitation Behavior and Impact Toughness with ..:

Ahiale, Godwin Kwame ; Kim, Doo-Hyun ; Yang, Won-Jon..
Metals and Materials International. 24 (2018) 4 - p. 738-745 , 2018

Link: https://doi.org/10.1007/..

5

Image processing acceleration for intelligent unmanned aeri..:

Jeon, Dongwoon ; Kim, Doo-Hyun ; Ha, Young-Guk.
Soft Computing. 20 (2015) 5 - p. 1713-1720 , 2015

Link: https://doi.org/10.1007/..

6

Fast CAVLD of H.264/AVC on bitstream decoding processor:

Seo, Jung-Han ; Jo, Hyun-Ho ; Sim, Dong-Gyu..
EURASIP Journal on Image and Video Processing. 2013 (2013) 1 - p. , 2013

Link: https://doi.org/10.1186/..

7

The effect of bath conditions on the electroless nickel pla..:

Cheon, So-Young ; Park, So-Yeon ; Rhym, Young-Mok..
Current Applied Physics. 11 (2011) 3 - p. 790-793 , 2011

Link: https://doi.org/10.1016/..

8

A New 1T DRAM Cell: Cone Type 1T DRAM Cell:

LEE, Gil Sung ; KIM, Doo-Hyun ; CHO, Seongjae.
IEICE Transactions on Electronics. E94-C (2011) 5 - p. 681-685 , 2011

Link: https://doi.org/10.1587/..

9

Polyelectrolyte-assisted synthesis of polystyrene microsphe..:

Hong, Jinho ; Lee, Jeongwoo ; Rhym, Young-Mok..
Journal of Colloid and Interface Science. 344 (2010) 2 - p. 410-416 , 2010

Link: https://doi.org/10.1016/..

10

Program/Erase Model of Nitride-Based NAND-Type Charge Trap ..:

Kim, Doo-Hyun ; Cho, Seongjae ; Li, Dong Hua...
Japanese Journal of Applied Physics. 49 (2010) 8R - p. 084301 , 2010

Link: https://doi.org/10.1143/..

11

Simulation of Retention Characteristics in Double-Gate Stru..:

KIM, Doo-Hyun ; PARK, Il Han ; CHO, Seongjae...
IEICE Transactions on Electronics. E92-C (2009) 5 - p. 659-663 , 2009

Link: https://doi.org/10.1587/..

12

Experimental Evaluation of a Hybrid Approach for Deriving S..:

, In: IFIP Advances in Information and Communication Technology; Analysis, Architectures and Modelling of Embedded Systems,

Colmenares, Juan A. ; Kim, K. H. ; Kim, Doo-Hyun - p. 139-148 , 2009

Link: https://doi.org/10.1007/..

13

Effects of Plasma Process Induced Damages on Organic Gate D..:

Kim, Doo-Hyun ; Kim, Dong-Woo ; Kim, Keon-Soo...
Japanese Journal of Applied Physics. 47 (2008) 7R - p. 5672 , 2008

Link: https://doi.org/10.1143/..

14

Enantioselective synthesis of (R)-(+)- and (S)-(−)-higenami..:

Pyo, Mi Kyung ; Lee, Duck-Hyung ; Kim, Doo-Hyun...
Bioorganic & Medicinal Chemistry Letters. 18 (2008) 14 - p. 4110-4114 , 2008

Link: https://doi.org/10.1016/..

15

Fabrication and characterization of fin SONOS flash memory ..:

Yun, Jang-Gn ; Kim, Yoon ; Park, Il Han...
Solid-State Electronics. 52 (2008) 10 - p. 1498-1504 , 2008

Link: https://doi.org/10.1016/..