E-LIB Suche - Ergebnisse für: Kim, Jayong

1

Review of Material Properties of Oxide Semiconductor Thin F..:

Choi, Ae Rim ; Lim, Dong Hyun ; Shin, So-Yeon...
Chemistry of Materials. , 2024

Link: https://doi.org/10.1021/..

2

Demonstration of Ultra-thin Ferroelectric/dielectric and An..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Suh, Dong Ik ; Koo, Won-Tae ; Kim, Youngmo... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

3

Low Voltage and High Speed 1Xnm 1T1C FE-RAM with Ultra-Thin..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),

Sung, Minchul ; Rho, Kwangmyoung ; Kim, Jayong... - p. 33.3.1-33.3.4 , 2021

Link: https://doi.org/10.1109/..

4

A Hybrid Modeling Approach for an Automated Lyrics-Rating S..:

, In: Lecture Notes in Computer Science; Advances in Information Retrieval,

Kim, Jayong ; Yi, Mun Y. - p. 779-786 , 2019

Link: https://doi.org/10.1007/..

5

Effect of annealing conditions on formation of SrRuO3 films..:

Ahn, Ji-Hoon ; Kim, Ja-Yong
Microelectronic Engineering. 149 (2016) - p. 62-65 , 2016

Link: https://doi.org/10.1016/..

6

First-principles study of carbon impurity effects in the ps..:

Kim, Ja-Yong ; Magyari-Köpe, Blanka ; Nishi, Yoshio.
Current Applied Physics. 16 (2016) 6 - p. 638-643 , 2016

Link: https://doi.org/10.1016/..

7

Plasma-enhanced atomic layer deposition of SnO2 thin films ..:

Lee, Dong-Kwon ; Wan, Zhixin ; Bae, Jong-Seong...
Materials Letters. 166 (2016) - p. 163-166 , 2016

Link: https://doi.org/10.1016/..

8

Effect of Al2O3 insertion on the electrical properties of S..:

Ahn, Ji-Hoon ; Kim, Ja-Yong ; Jeong, Seong-Jun.
Materials Research Bulletin. 64 (2015) - p. 1-5 , 2015

Link: https://doi.org/10.1016/..

9

Electronic structure and stability of low symmetry Ta2O5pol..:

Kim, Ja‐Yong ; Magyari‐Köpe, Blanka ; Lee, Kee‐Jeung...
physica status solidi (RRL) – Rapid Research Letters. 8 (2014) 6 - p. 560-565 , 2014

Link: https://doi.org/10.1002/..

10

Ru Films from Bis(ethylcyclopentadienyl)ruthenium Using Ozo..:

Kim, Ja-Yong ; Kil, Deok-Sin ; Kim, Jin-Hyock...
Journal of The Electrochemical Society. 159 (2012) 6 - p. H560-H564 , 2012

Link: https://doi.org/10.1149/..

11

Thermal stability of RuO2 thin films prepared by modified a..:

Kim, Jin-Hyock ; Ahn, Ji-Hoon ; Kang, Sang-Won...
Current Applied Physics. 12 (2012) - p. S160-S163 , 2012

Link: https://doi.org/10.1016/..

12

Effect of HfO2 Crystallinity on Device Characteristics and ..:

Kim, Ja-Yong ; Yoo, Jong-Hee ; Youn, Tae-One...
Electrochemical and Solid-State Letters. 14 (2011) 8 - p. H337 , 2011

Link: https://doi.org/10.1149/..

13

Effect of HfO2 Crystallinity on Device Characteristics and ..:

Kim, Ja-Yong ; Joo, M. S. ; Yoo, J. H....
ECS Transactions. 35 (2011) 2 - p. 245-248 , 2011

Link: https://doi.org/10.1149/..

14

Theoretical Simulation of Surface Evolution Using the Rando..:

Ahn, Ji-Hoon ; Kwon, Se-Hun ; Kim, Jin-Hyock..
Journal of Materials Science & Technology. 26 (2010) 4 - p. 371-374 , 2010

Link: https://doi.org/10.1016/..

15

Enhanced Dielectric Properties of SrTiO[sub 3] Films with a..:

Ahn, Ji-Hoon ; Kim, Ja-Yong ; Kim, Jin-Hyock..
Electrochemical and Solid-State Letters. 12 (2009) 2 - p. G5 , 2009

Link: https://doi.org/10.1149/..