Kim, Min-Koo Han
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12

Effect of Dynamic Bias Stress in Short-Channel (L=1.5 µm) p..:

Choi, Sung-Hwan ; Mo, Yeon-Gon ; Kim, Hye-Dong.
Japanese Journal of Applied Physics.  51 (2012)  2R - p. 021401 , 2012
 
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13

Hot-Carrier Effects in Short Channel (L = 1.5 µm) p-Type Po..:

Choi, Sung-Hwan ; Mo, Yeon-Gon ; Kim, Hye-Dong.
Japanese Journal of Applied Physics.  51 (2012)  2R - p. 024103 , 2012
 
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14

Effect of Channel Length on the Reliability of Amorphous In..:

Lee, Soo-Yeon ; Kim, Sun-Jae ; Lee, Young Wook...
Japanese Journal of Applied Physics.  51 (2012)  3S - p. 03CB03 , 2012
 
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15

Effect of Charge Trapping∕Detrapping on Threshold Voltage S..:

Kim, Sun-Jae ; Lee, Soo-Yeon ; Lee, Young Wook...
Electrochemical and Solid-State Letters.  15 (2012)  4 - p. H108 , 2012
 
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