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Kirkland, AI
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1

Exploring the Validity Limits of Direct Ptychographic Metho..:

Clark, L ; Martinez, GT ; Liberti, E...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 420-421 , 2022
Link: https://doi.org/10.1017/..
 
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2

Applications of Low Dose Electron Ptychography:

Kirkland, AI ; Kim, J S ; Allen, C S...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 352-354 , 2022
Link: https://doi.org/10.1017/..
 
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3

Three-Dimensional Resolution Limits and Image Contrast Mech..:

Nellist, PD ; Wang, P ; Behan, G...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1834-1835 , 2010
Link: https://doi.org/10.1017/..
 
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4

Establishment of Annular Dark-Field Scanning Confocal Elect..:

Hashimoto, A ; Wang, P ; Shimojo, M...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1888-1889 , 2010
Link: https://doi.org/10.1017/..
 
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5

Recording low Spatial Frequencies While Maintaining Informa..:

Haigh, S ; Jiang, B ; Alloyeau, D..
Microscopy and Microanalysis.  16 (2010)  S2 - p. 524-525 , 2010
Link: https://doi.org/10.1017/..
 
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6

Three Dimensional Characterization of a Silica Hollow Spher..:

Takeguchi, M ; Okuda, M ; Hashimoto, A...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1836-1837 , 2010
Link: https://doi.org/10.1017/..
 
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7

Processing and Aberration-Corrected Imaging of Novel Low-Di..:

Nicolosi, V ; Aslam, Z ; Kim, J...
Microscopy and Microanalysis.  16 (2010)  S2 - p. 76-77 , 2010
Link: https://doi.org/10.1017/..
 
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8

Energy Filtered Scanning Confocal Electron Microscopy in a ..:

Wang, P ; Behan, G ; Kirkland, AI.
Microscopy and Microanalysis.  15 (2009)  S2 - p. 42-43 , 2009
Link: https://doi.org/10.1017/..
 
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9

Aberration Correction and Exit Wave Reconstruction Using Ti..:

Kirkland, AI ; Haigh, S
Microscopy and Microanalysis.  15 (2009)  S2 - p. 1472-1473 , 2009
Link: https://doi.org/10.1017/..
 
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10

Real-space Measurements of Bonding Charge Density in Aberra..:

Ciston, J ; Haigh, SJ ; Kim, JS..
Microscopy and Microanalysis.  15 (2009)  S2 - p. 1478-1479 , 2009
Link: https://doi.org/10.1017/..
 
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11

Counting Electrons in Transmission Electron Microscopes:

Moldovan, G ; Li, X ; Wilshaw, P.
Microscopy and Microanalysis.  14 (2008)  S2 - p. 912-913 , 2008
Link: https://doi.org/10.1017/..
 
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12

Three-dimensional imaging and analysis by optical sectionin..:

Nellist, PD ; Cosgriff, EC ; Behan, G...
Microscopy and Microanalysis.  14 (2008)  S2 - p. 104-105 , 2008
Link: https://doi.org/10.1017/..
 
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13

STM and HRTEM of Nanostructures and Metal Nanocrystals on S..:

Marsh, HL ; Deak, DS ; Silly, F...
Microscopy and Microanalysis.  13 (2007)  S02 - p. , 2007
Link: https://doi.org/10.1017/..
 
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14

Prospects for 3D Characterization of Materials by Aberratio..:

Nellist, PD ; Cosgriff, EC ; Behan, G.
Microscopy and Microanalysis.  13 (2007)  S02 - p. , 2007
Link: https://doi.org/10.1017/..
 
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15

Aberration Corrected Tilt Series Reconstruction:

Haigh, S ; Kirkland, AI ; Chang, LY
Microscopy and Microanalysis.  13 (2007)  S02 - p. , 2007
Link: https://doi.org/10.1017/..
 
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