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Kissinger, Gudrun
33
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Online (32)
Print (1)
Mediatypes
Books (1)
Articles (Online) (30)
Bookchapter (Online) (2)
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?
1
Investigation of the impact of amorphous silicon layers dep..:
Kissinger, Gudrun
;
Kot, Dawid
;
Bärwolf, Florian
.
Materials Science in Semiconductor Processing. 164 (2023) - p. 107614 , 2023
Link:
https://doi.org/10.1016/..
?
2
Simulation of Nitrogen Indiffusion and Its Impact on Silico..:
Müller, Timo
;
Kissinger, Gudrun
;
Kot, Dawid
...
physica status solidi (a). 218 (2021) 23 - p. , 2021
Link:
https://doi.org/10.1002/..
?
3
List of contributors:
, In:
Handbook of Silicon Based MEMS Materials and Technologies
,
Aalto, Timo
;
Airaksinen, Veli-Matti
;
Albert, Stephan Gerhard
... - p. xv-xvii , 2020
Link:
https://doi.org/10.1016/..
?
4
Measuring oxygen and bulk microdefects in silicon:
, In:
Handbook of Silicon Based MEMS Materials and Technologies
,
Savin, Hele
;
Kissinger, Gudrun
;
Airaksinen, Veli-Matti
- p. 775-779 , 2020
Link:
https://doi.org/10.1016/..
?
5
Gettering and Defect Engineering in Semiconductor Technolog..:
Kissinger, Gudrun
;
Kot, Dawid
;
Richter, Hans
.
physica status solidi (a). 216 (2019) 17 - p. , 2019
Link:
https://doi.org/10.1002/..
?
6
Near‐Surface Defect Control by Vacancy Injecting/Out‐Diffus..:
Müller, Timo
;
Gehmlich, Michael
;
Sattler, Andreas
...
physica status solidi (a). 216 (2019) 17 - p. , 2019
Link:
https://doi.org/10.1002/..
?
7
(Invited) Oxygen in Silicon: End of the Story?:
Kissinger, Gudrun
;
Kot, Dawid
;
Schubert, Markus Andreas
...
ECS Transactions. 86 (2018) 10 - p. 61-71 , 2018
Link:
https://doi.org/10.1149/..
?
8
VOn Complexes in RTA Treated Czochralski Silicon Wafers Inv..:
Kot, Dawid
;
Kissinger, Gudrun
;
Dabrowski, Jaroslaw
.
ECS Transactions. 86 (2018) 10 - p. 95-103 , 2018
Link:
https://doi.org/10.1149/..
?
9
Sensitivity enhanced FTIR investigation of defects introduc..:
Kot, Dawid
;
Kissinger, Gudrun
;
Sattler, Andreas
Semiconductor Science and Technology. 32 (2017) 10 - p. 104006 , 2017
Link:
https://doi.org/10.1088/..
?
10
About the influence of deposited nitride layers on oxide pr..:
Kissinger, Gudrun
;
Kot, Dawid
;
Dabrowski, Jaroslaw
...
physica status solidi (a). 214 (2017) 7 - p. , 2017
Link:
https://doi.org/10.1002/..
?
11
(Invited) Current Stage of the Investigation of the Composi..:
Kot, Dawid
;
Kissinger, Gudrun
;
Schubert, Markus Andreas
.
ECS Transactions. 75 (2016) 4 - p. 53-67 , 2016
Link:
https://doi.org/10.1149/..
?
12
Investigation of the Composition of the Si/SiO2 Interface i..:
Kissinger, Gudrun
;
Schubert, Markus Andreas
;
Kot, Dawid
.
ECS Transactions. 75 (2016) 4 - p. 81-95 , 2016
Link:
https://doi.org/10.1149/..
?
13
Composition of oxygen precipitates in Czochralski silicon w..:
Kot, Dawid
;
Kissinger, Gudrun
;
Schubert, Markus Andreas
...
physica status solidi (RRL) – Rapid Research Letters. 9 (2015) 7 - p. 405-409 , 2015
Link:
https://doi.org/10.1002/..
?
14
Internal Gettering of Copper for Microelectronic Applicatio..:
Kissinger, Gudrun
;
Kot, Dawid
;
Schubert, Markus Andreas
..
Solid State Phenomena. 242 (2015) - p. 236-245 , 2015
Link:
https://doi.org/10.4028/..
?
15
Simulation of vacancy agglomeration based on ab initio calc..:
Kissinger, Gudrun
;
Dabrowski, Jarek
;
Kot, Dawid
Japanese Journal of Applied Physics. 53 (2014) 5S1 - p. 05FJ06 , 2014
Link:
https://doi.org/10.7567/..
1-15