Kitano, Tomohisa
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4

Infrared studies of transition layers at SiO2/Si interface:

Ono, Haruhiko ; Ikarashi, Taeko ; Ando, Koichi.
Journal of Applied Physics.  84 (1998)  11 - p. 6064-6069 , 1998
 
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Annealing Properties of Defects in B+- and F+-Implanted Si ..:

Uedono, Akira ; Kitano, Tomohisa ; Hamada, Kouji...
Japanese Journal of Applied Physics.  36 (1997)  5R - p. 2571 , 1997
 
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Silicon Surface Imperfection Probed with a Novel X-Ray Diff..:

Kitano, Tomohisa ; Hasegawa, Eiji ; Tsukiji, Masaru...
Japanese Journal of Applied Physics.  32 (1993)  11A - p. L1581 , 1993
 
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11

Developing a multipurpose SR beam line highly efficient in ..:

Kawase, Yutaka ; Mizuki, Jun'ichiro ; Akimoto, Koichi...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  266 (1988)  1-3 - p. 238-242 , 1988
 
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12

Fluorescence EXAFS Study of Zn-Doped LEC InP Crystal:

Kitano, Tomohisa ; Watanabe, Hisao ; Matsui, Junji
Japanese Journal of Applied Physics.  27 (1988)  1A - p. L9 , 1988
 
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13

Appropriate Pulling Axis Orientation to Suppress Slip Dislo..:

Kitano, Tomohisa ; Matsui, Junji
Japanese Journal of Applied Physics.  27 (1988)  5A - p. L740 , 1988
 
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15

Fluorescence EXAFS Study of AlGaAs Doped with Se Donor Impu..:

Kitano, Tomohisa ; Mizuta, Masashi
Japanese Journal of Applied Physics.  26 (1987)  11A - p. L1806 , 1987
 
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