Search for persons
X
?
2024 IEEE European Test Symposium (ETS) ,
1
Time and Space Optimized Storage-based BIST under Multiple ..:
, In:
?
2024 IEEE 25th Latin American Test Symposium (LATS) ,
2
Vmin Testing under Variations: Defect vs. Fault Coverage:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
3
Machine Learning Unleashes Aging and Self-Heating Effects: ..:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
5
On the Severity of Self-Heating in FDSOI at Cryogenic Tempe..:
, In:
?
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
6
Robust Resistive Open Defect Identification Using Machine L..:
, In:
?
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
7
Learning-Oriented Reliability Improvement of Computing Syst..:
, In:
?
2023 60th ACM/IEEE Design Automation Conference (DAC) ,
9
Design Automation for Cryogenic CMOS Circuits:
, In:
?
Proceedings of the 28th Asia and South Pacific Design Automation Conference ,
10
ML to the Rescue : Reliability Estimation from Self-Heat..:
, In:
?
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
11
Upheaving Self-Heating Effects from Transistor to Circuit L..:
, In:
?
2023 IEEE International Test Conference (ITC) ,
13
Robust Pattern Generation for Small Delay Faults Under Proc..:
, In:
?
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
14